Shianling Wu

Person

Princeton Junction, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing 3D integrated circuits
- Patent number 8,522,096
- Issue date Aug 27, 2013
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-capture DFT system to reduce peak capture power during sel...
- Patent number 8,458,544
- Issue date Jun 4, 2013
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Robust scan synthesis for protecting soft errors
- Patent number 8,418,100
- Issue date Apr 9, 2013
- STARDFX Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for low-pin-count scan compression
- Patent number 8,335,954
- Issue date Dec 18, 2012
- Syntest Technologies, Inc.
- Nur A. Touba
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for low-pin-count scan compression
- Patent number 8,230,282
- Issue date Jul 24, 2012
- Syntest Technologies, Inc.
- Nur A. Touba
- G01 - MEASURING TESTING
Information Patent Grant
Robust scan synthesis for protecting soft errors
- Patent number 8,161,441
- Issue date Apr 17, 2012
- STARDFX Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-capture DFT system to reduce peak capture power during sel...
- Patent number 8,091,002
- Issue date Jan 3, 2012
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for low-pin-count scan compression
- Patent number 7,996,741
- Issue date Aug 9, 2011
- Syntest Technologies, Inc.
- Nur A. Touba
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pipelined scan compression
- Patent number 7,945,833
- Issue date May 17, 2011
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for redundancy reconfiguration of faculty memories
- Patent number 7,783,940
- Issue date Aug 24, 2010
- Syntest Technologies, Inc.
- Lizhen Yu
- G11 - INFORMATION STORAGE
Information Patent Grant
Compacting test responses using X-driven compactor
- Patent number 7,779,322
- Issue date Aug 17, 2010
- Syntest Technologies, Inc.
- Zhigang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for broadcasting test patterns in a scan-based...
- Patent number 7,721,172
- Issue date May 18, 2010
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for pipelined scan compression
- Patent number 7,590,905
- Issue date Sep 15, 2009
- Syntest Technologies, Inc.
- Khader S. Abdel-Hafez
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for shifting at-speed scan patterns in a scan-...
- Patent number 7,512,851
- Issue date Mar 31, 2009
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for broadcasting test patterns in a scan based...
- Patent number 7,412,637
- Issue date Aug 12, 2008
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for multi-level scan compression
- Patent number 7,231,570
- Issue date Jun 12, 2007
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION
- Publication number 20140143623
- Publication date May 22, 2014
- Syntest Technologies, Inc.
- Nur A. TOUBA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION
- Publication number 20120266036
- Publication date Oct 18, 2012
- Syntest Technologies, Inc.
- Nur A. TOUBA
- G01 - MEASURING TESTING
Information Patent Application
ROBUST SCAN SYNTHESIS FOR PROTECTING SOFT ERRORS
- Publication number 20120173940
- Publication date Jul 5, 2012
- StarDFX Technologies, Inc.
- Laung-Terng WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE-CAPTURE DFT SYSTEM TO REDUCE PEAK CAPTURE POWER DURING SEL...
- Publication number 20120166903
- Publication date Jun 28, 2012
- Syntest Technologies, Inc.
- Laung-Terng WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING 3D INTEGRATED CIRCUITS
- Publication number 20120110402
- Publication date May 3, 2012
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION
- Publication number 20110258501
- Publication date Oct 20, 2011
- Sytest Technologies, Inc.
- Nur A. TOUBA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION
- Publication number 20110047426
- Publication date Feb 24, 2011
- Nur A. TOUBA
- G01 - MEASURING TESTING
Information Patent Application
FPGA Test Configuration Minimization
- Publication number 20110022907
- Publication date Jan 27, 2011
- StarDFX Technologies, Inc.
- Zhigang Jiang
- G01 - MEASURING TESTING
Information Patent Application
ROBUST SCAN SYNTHESIS FOR PROTECTING SOFT ERRORS
- Publication number 20110022908
- Publication date Jan 27, 2011
- StarDFX Technologies, Inc.
- Laung-Terng WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE-CAPTURE DFT SYSTEM TO REDUCE PEAK CAPTURE POWER DURING SEL...
- Publication number 20100287430
- Publication date Nov 11, 2010
- Syntest Technologies, Inc.
- Laung-Terng WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DELAY FAULT COVERAGE ENHANCEMENT
- Publication number 20100138709
- Publication date Jun 3, 2010
- Laung-Terng WANG
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for redundancy reconfiguration of faculty memories
- Publication number 20090303815
- Publication date Dec 10, 2009
- Lizhen Yu
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for broadcasting scan patterns in a random acc...
- Publication number 20080276143
- Publication date Nov 6, 2008
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for broadcasting scan patterns in a random acc...
- Publication number 20060242502
- Publication date Oct 26, 2006
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for pipelined scan compression
- Publication number 20060064614
- Publication date Mar 23, 2006
- Khader S. Abdel-Hafez
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for multi-level scan compression
- Publication number 20050268194
- Publication date Dec 1, 2005
- Laung-Terng (L.T.) Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for shifting at-speed scan patterns in a scan-...
- Publication number 20050055617
- Publication date Mar 10, 2005
- Laung-Terng Wang
- G01 - MEASURING TESTING

Shianling Wu

Person

Patents Grantslast 30 patents

Method and apparatus for testing 3D integrated circuits

Multiple-capture DFT system to reduce peak capture power during sel...

Robust scan synthesis for protecting soft errors

Method and apparatus for low-pin-count scan compression

Method and apparatus for low-pin-count scan compression

Robust scan synthesis for protecting soft errors

Multiple-capture DFT system to reduce peak capture power during sel...

Method and apparatus for low-pin-count scan compression

Method and apparatus for pipelined scan compression

Apparatus for redundancy reconfiguration of faculty memories

Compacting test responses using X-driven compactor

Method and apparatus for broadcasting test patterns in a scan-based...

Method and apparatus for pipelined scan compression

Method and apparatus for shifting at-speed scan patterns in a scan-...

Method and apparatus for broadcasting test patterns in a scan based...

Method and apparatus for multi-level scan compression

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION

METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION

ROBUST SCAN SYNTHESIS FOR PROTECTING SOFT ERRORS

MULTIPLE-CAPTURE DFT SYSTEM TO REDUCE PEAK CAPTURE POWER DURING SEL...

METHOD AND APPARATUS FOR TESTING 3D INTEGRATED CIRCUITS

METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION

METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION

FPGA Test Configuration Minimization

ROBUST SCAN SYNTHESIS FOR PROTECTING SOFT ERRORS

MULTIPLE-CAPTURE DFT SYSTEM TO REDUCE PEAK CAPTURE POWER DURING SEL...

METHOD AND APPARATUS FOR DELAY FAULT COVERAGE ENHANCEMENT

Apparatus for redundancy reconfiguration of faculty memories

Method and apparatus for broadcasting scan patterns in a random acc...

Method and apparatus for broadcasting scan patterns in a random acc...

Method and apparatus for pipelined scan compression

Method and apparatus for multi-level scan compression

Method and apparatus for shifting at-speed scan patterns in a scan-...