Shiano Ono

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Patents Grantslast 30 patents

Information Patent Grant
Multi-part specimen holder with conductive patterns
- Patent number 8,334,519
- Issue date Dec 18, 2012
- Hitachi, Ltd.
- Shiano Ono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Specimen Analyzing Apparatus and Specimen Holder
- Publication number 20080067374
- Publication date Mar 20, 2008
- Shiano Ono
- G01 - MEASURING TESTING