Shibing QIAN

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Hefei, CN

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Patents Grantslast 30 patents

Information Patent Grant
Parasitic capacitance detection method, memory and readable storage...
- Patent number 11,867,745
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shibing Qian
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measuring temperature of wafer chuck and calibrating te...
- Patent number 11,852,542
- Issue date Dec 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shibing Qian
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND A METHOD MAKING THE SAME
- Publication number 20230061462
- Publication date Mar 2, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shibing Qian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARASITIC CAPACITANCE DETECTION METHOD, MEMORY AND READABLE STORAGE...
- Publication number 20220120806
- Publication date Apr 21, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shibing Qian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR MEASURING TEMPERATURE OF WAFER CHUCK AND CALIBRATING TE...
- Publication number 20210341342
- Publication date Nov 4, 2021
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shibing QIAN
- H01 - BASIC ELECTRIC ELEMENTS