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Shenzhen, Guangdong, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Terahertz metamaterial waveguide and device
Patent number
11,275,198
Issue date
Mar 15, 2022
Shenzhen Terahertz System Equipment Co., Ltd.
Yi Pan
G02 - OPTICS
Information
Patent Grant
Terahertz full polarization state detection spectrometer
Patent number
11,199,495
Issue date
Dec 14, 2021
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION CO., LTD.
Qing Ding
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz full-polarization-state detection spectrograph
Patent number
10,983,048
Issue date
Apr 20, 2021
Shenzhen Terahertz System Equipment Co., Ltd.
Yi Pan
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz time-domain spectroscopy system
Patent number
10,408,679
Issue date
Sep 10, 2019
Shenzhen Institute of Terahertz Technology and Innovation
Shichang Peng
G01 - MEASURING TESTING
Information
Patent Grant
Delay line device and terahertz time-domain spectrometer system
Patent number
10,161,790
Issue date
Dec 25, 2018
Shenzhen Institute of Terahertz Technology and Innovation
Qing Ding
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Terahertz Full-Polarization-State Detection Spectrograph
Publication number
20200284722
Publication date
Sep 10, 2020
Shenzhen Institute of Terahertz Technology and Innovation
Yi Pan
G01 - MEASURING TESTING
Information
Patent Application
Terahertz Metamaterial Waveguide And Device
Publication number
20200217984
Publication date
Jul 9, 2020
Shenzhen Terahertz System Equipment Co., Ltd.
Yi Pan
G02 - OPTICS
Information
Patent Application
TERAHERTZ FULL POLARIZATION STATE DETECTION SPECTROMETER
Publication number
20190003964
Publication date
Jan 3, 2019
Shenzhen Institute of Terahertz Tchnology and Innovation Co., Ltd.
Qing Ding
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ TIME-DOMAIN SPECTROSCOPY SYSTEM
Publication number
20180306644
Publication date
Oct 25, 2018
SHENZHEN INSTITUTE OF TERAHERTZ TECHNOLOGY AND INNOVATION CO., LTD.
Shichang PENG
G01 - MEASURING TESTING
Information
Patent Application
Delay Line Device And Terahertz Time-Domain Spectrometer System
Publication number
20180274978
Publication date
Sep 27, 2018
Shenzhen Institute of Terahertz Technology and Innovation
Qing Ding
G01 - MEASURING TESTING