Shien Cho

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method and method of manufacturing semiconductor device
- Patent number 9,343,319
- Issue date May 17, 2016
- Renesas Electronics Corporation
- Shien Cho
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device and manufacturing method therefor
- Patent number 9,082,704
- Issue date Jul 14, 2015
- Renesas Electronics Corporation
- Shien Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating a film
- Patent number 8,131,492
- Issue date Mar 6, 2012
- Renesas Electronics Corporation
- Shien Cho
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory and method for manufacturing the same
- Patent number 8,063,435
- Issue date Nov 22, 2011
- Renesas Electronics Corporation
- Shien Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile memory semiconductor device and method for manufacturin...
- Patent number 7,683,420
- Issue date Mar 23, 2010
- NEC Electronics Corporation
- Shien Cho
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20150125969
- Publication date May 7, 2015
- RENESAS ELECTRONICS CORPORATION
- Shien CHO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device and manufacturing method therefor
- Publication number 20090250744
- Publication date Oct 8, 2009
- NEC Electronics Corporation
- Shien Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20090194809
- Publication date Aug 6, 2009
- NEC ELECTRONICS CORPORATION
- Shien Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EVALUATING A FILM
- Publication number 20080183420
- Publication date Jul 31, 2008
- NEC Electronics Corporation
- Shien Cho
- G01 - MEASURING TESTING
Information Patent Application
Nonvolatile memory semiconductor device and method for manufacturin...
- Publication number 20070023814
- Publication date Feb 1, 2007
- NEC Electronics Corporation
- Shien Cho
- H01 - BASIC ELECTRIC ELEMENTS