Shigeharu Yamamoto

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting a defect of an object to be meas...
- Patent number 5,907,098
- Issue date May 25, 1999
- Iwatsu Electric Co., Ltd.
- Kiyoshi Tsuboi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring change in state of object to be...
- Patent number 5,777,228
- Issue date Jul 7, 1998
- Iwatsu Electric Co., Ltd.
- Kiyoshi Tsuboi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for predicting the life of an object to be mea...
- Patent number 5,696,324
- Issue date Dec 9, 1997
- Iwatsu Electric Co., Ltd.
- Kiyoshi Tsuboi
- G01 - MEASURING TESTING