Shigehiko IWAMA

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analysis threshold generation device and analysis threshold generat...
- Patent number 12,007,387
- Issue date Jun 11, 2024
- JVCKENWOOD CORPORATION
- Atsushi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Analysis threshold determination device and analysis threshold dete...
- Patent number 11,927,521
- Issue date Mar 12, 2024
- JVCKENWOOD CORPORATION
- Atsushi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and method for detection target substance analysis
- Patent number 11,692,924
- Issue date Jul 4, 2023
- JVCKENWOOD CORPORATION
- Masayuki Ono
- G01 - MEASURING TESTING
Information Patent Grant
Analysis unit, washing device, and washing method
- Patent number 11,549,938
- Issue date Jan 10, 2023
- JVCKENWOOD CORPORATION
- Shigehiko Iwama
- G01 - MEASURING TESTING
Information Patent Grant
Nanoparticle measurement device, analysis device, and analysis method
- Patent number 11,499,968
- Issue date Nov 15, 2022
- JVC Kenwood Corporation
- Shigehiko Iwama
- G01 - MEASURING TESTING
Information Patent Grant
Washing apparatus and washing method
- Patent number 11,344,924
- Issue date May 31, 2022
- JVCKENWOOD CORPORATION
- Shigehiko Iwama
- B08 - CLEANING
Information Patent Grant
Analysis device and analysis method
- Patent number 11,300,580
- Issue date Apr 12, 2022
- JVC Kenwood Corporation
- Shigehiko Iwama
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 11,131,621
- Issue date Sep 28, 2021
- JVC Kenwood Corporation
- Atsushi Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical disc device, optical disc rotation position detection metho...
- Patent number 11,003,371
- Issue date May 11, 2021
- JVCKENWOOD CORPORATION
- Masahiro Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of capturing exosomes
- Patent number 10,962,531
- Issue date Mar 30, 2021
- JVC Kenwood Corporation
- Makoto Itonaga
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 10,866,233
- Issue date Dec 15, 2020
- JVC Kenwood Corporation
- Shigehiko Iwama
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 10,809,178
- Issue date Oct 20, 2020
- JVC Kenwood Corporation
- Shigehiko Iwama
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Magnet structure, clamping mechanism, and optical disc apparatus
- Patent number 10,629,237
- Issue date Apr 21, 2020
- JVC Kenwood Corporation
- Shigehiko Iwama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis method and analysis device
- Patent number 10,520,417
- Issue date Dec 31, 2019
- JVC Kenwood Corporation
- Masayuki Ono
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF FABRICATING SUBSTRATE FOR ANALYSIS, SUBSTRATE FOR ANALYSI...
- Publication number 20210405036
- Publication date Dec 30, 2021
- JVCKENWOOD CORPORATION
- Koji TSUJITA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20210148808
- Publication date May 20, 2021
- JVCKENWOOD CORPORATION
- Masayuki ONO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS THRESHOLD GENERATION DEVICE AND ANALYSIS THRESHOLD GENERAT...
- Publication number 20210088508
- Publication date Mar 25, 2021
- JVCKENWOOD CORPORATION
- Atsushi SAITO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS THRESHOLD DETERMINATION DEVICE AND ANALYSIS THRESHOLD DETE...
- Publication number 20210080373
- Publication date Mar 18, 2021
- JVCKENWOOD CORPORATION
- Atsushi SAITO
- G01 - MEASURING TESTING
Information Patent Application
Analysis Unit, Washing Device, and Washing Method
- Publication number 20200284784
- Publication date Sep 10, 2020
- JVCKENWOOD CORPORATION
- Shigehiko IWAMA
- G01 - MEASURING TESTING
Information Patent Application
WASHING APPARATUS AND WASHING METHOD
- Publication number 20200246843
- Publication date Aug 6, 2020
- JVCKENWOOD CORPORATION
- Shigehiko IWAMA
- B08 - CLEANING
Information Patent Application
Optical Disc Device, Optical Disc Rotation Position Detection Metho...
- Publication number 20200167090
- Publication date May 28, 2020
- JVCKENWOOD CORPORATION
- Masahiro YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Nanoparticle Measurement Device, Analysis Device, and Analysis Method
- Publication number 20190293640
- Publication date Sep 26, 2019
- JVC KENWOOD CORPORATION
- Shigehiko IWAMA
- G01 - MEASURING TESTING
Information Patent Application
Magnet Structure, Clamping Mechanism, and Optical Disc Apparatus
- Publication number 20190206435
- Publication date Jul 4, 2019
- JVC KENWOOD CORPORATION
- Shigehiko IWAMA
- G11 - INFORMATION STORAGE
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20190145885
- Publication date May 16, 2019
- JVC KENWOOD CORPORATION
- Atsushi SAITO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD AND ANALYSIS DEVICE
- Publication number 20190064048
- Publication date Feb 28, 2019
- JVC KENWOOD CORPORATION
- Masayuki ONO
- G01 - MEASURING TESTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20180321227
- Publication date Nov 8, 2018
- JVC KENWOOD CORPORATION
- Shigehiko IWAMA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20180238790
- Publication date Aug 23, 2018
- JVC KENWOOD CORPORATION
- Shigehiko IWAMA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20180217175
- Publication date Aug 2, 2018
- JVC KENWOOD CORPORATION
- Shigehiko IWAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CAPTURING EXOSOMES
- Publication number 20180180604
- Publication date Jun 28, 2018
- JVC KENWOOD CORPORATION
- Makoto ITONAGA
- G01 - MEASURING TESTING

Shigehiko IWAMA

Person

Patents Grantslast 30 patents

Analysis threshold generation device and analysis threshold generat...

Analysis threshold determination device and analysis threshold dete...

Optical device and method for detection target substance analysis

Analysis unit, washing device, and washing method

Nanoparticle measurement device, analysis device, and analysis method

Washing apparatus and washing method

Analysis device and analysis method

Analysis device and analysis method

Optical disc device, optical disc rotation position detection metho...

Method of capturing exosomes

Analysis device and analysis method

Analysis device and analysis method

Magnet structure, clamping mechanism, and optical disc apparatus

Analysis method and analysis device

Patents Applicationslast 30 patents

METHOD OF FABRICATING SUBSTRATE FOR ANALYSIS, SUBSTRATE FOR ANALYSI...

ANALYSIS DEVICE AND ANALYSIS METHOD

ANALYSIS THRESHOLD GENERATION DEVICE AND ANALYSIS THRESHOLD GENERAT...

ANALYSIS THRESHOLD DETERMINATION DEVICE AND ANALYSIS THRESHOLD DETE...

Analysis Unit, Washing Device, and Washing Method

WASHING APPARATUS AND WASHING METHOD

Optical Disc Device, Optical Disc Rotation Position Detection Metho...

Nanoparticle Measurement Device, Analysis Device, and Analysis Method

Magnet Structure, Clamping Mechanism, and Optical Disc Apparatus

ANALYSIS DEVICE AND ANALYSIS METHOD

ANALYSIS METHOD AND ANALYSIS DEVICE

Analysis Device and Analysis Method

ANALYSIS DEVICE AND ANALYSIS METHOD

ANALYSIS DEVICE AND ANALYSIS METHOD

METHOD OF CAPTURING EXOSOMES