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Shigehisa NOZAWA
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Kamisato, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
Patent number
8,625,089
Issue date
Jan 7, 2014
Hitachi High-Technologies Corporation
Yoshio Bamba
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and inspection method
Patent number
8,314,930
Issue date
Nov 20, 2012
Hitachi High-Technologies Corporation
Koichi Taniguchi
G01 - MEASURING TESTING
Information
Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
Patent number
7,876,431
Issue date
Jan 25, 2011
Hitachi High-Technologies Corporation
Yoshio Bamba
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and inspection method
Patent number
7,847,928
Issue date
Dec 7, 2010
Hitachi High-Technologies Corporation
Koichi Taniguchi
G01 - MEASURING TESTING
Information
Patent Grant
Foreign matter inspection apparatus and foreign matter inspection m...
Patent number
7,589,833
Issue date
Sep 15, 2009
Hitachi High-Technologies Corporation
Yoshio Bamba
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20130033705
Publication date
Feb 7, 2013
Hitachi High-Technologies Corporation
Koichi TANIGUCHI
G01 - MEASURING TESTING
Information
Patent Application
FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION M...
Publication number
20110075136
Publication date
Mar 31, 2011
Hitachi High-Technologies Corporation
Yoshio BAMBA
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20110051131
Publication date
Mar 3, 2011
Hitachi High-Technologies Corporation
Koichi TANIGUCHI
G01 - MEASURING TESTING
Information
Patent Application
FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER INSPECTION M...
Publication number
20090303470
Publication date
Dec 10, 2009
Hitachi High-Technologies Corporation
Yoshio BAMBA
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20080297779
Publication date
Dec 4, 2008
Koichi TANIGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Foreign matter inspection apparatus and foreign matter inspection m...
Publication number
20080088848
Publication date
Apr 17, 2008
Hitachi High-Technologies Corporation
Yoshio BAMBA
G01 - MEASURING TESTING