Shigehisa Yamamoto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Silicon carbide epitaxial substrate and silicon carbide semiconduct...
- Patent number 10,858,757
- Issue date Dec 8, 2020
- Mitsubishi Electric Corporation
- Takanori Tanaka
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for manufacturing silicon carbide semiconductor apparatus, a...
- Patent number 9,874,596
- Issue date Jan 23, 2018
- Mitsubishi Electric Corporation
- Shoyu Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of verifying semiconductor integrated circuit reliability an...
- Patent number 6,470,479
- Issue date Oct 22, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Burn-in test method for a semiconductor chip and burn-in test appar...
- Patent number 6,404,219
- Issue date Jun 11, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in method and burn-in device
- Patent number 6,372,528
- Issue date Apr 16, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing semiconductor devices
- Patent number 6,127,837
- Issue date Oct 3, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus and testing method thereof
- Patent number 6,037,794
- Issue date Mar 14, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Design aiding apparatus and method for designing a semiconductor de...
- Patent number 6,024,478
- Issue date Feb 15, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for evaluating reliability of interconnect wires
- Patent number 5,900,735
- Issue date May 4, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Crystal orientation detectable semiconductor substrate, and methods...
- Patent number 5,876,819
- Issue date Mar 2, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Yasuhiro Kimura
- C30 - CRYSTAL GROWTH
Information Patent Grant
Input protection circuit
- Patent number 5,696,398
- Issue date Dec 9, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS
- Publication number 20240387201
- Publication date Nov 21, 2024
- Mitsubishi Electric Corporation
- Hirofumi OKI
- B24 - GRINDING POLISHING
Information Patent Application
SILICON CARBIDE EPITAXIAL SUBSTRATE AND SILICON CARBIDE SEMICONDUCT...
- Publication number 20190145021
- Publication date May 16, 2019
- MITSUBISHI ELECTRIC CORPORATION
- Takanori TANAKA
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR APPARATUS, A...
- Publication number 20160003889
- Publication date Jan 7, 2016
- Mitsubishi Electric corporation
- Shoyu WATANABE
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN TEST METHOD FOR A SEMICONDUCTOR CHIP AND BURN-IN TEST APPAR...
- Publication number 20020050813
- Publication date May 2, 2002
- SHIGEHISA YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN METHOD AND BURN-IN DEVICE
- Publication number 20020039800
- Publication date Apr 4, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Shigehisa Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Burn-in system and burn-in method
- Publication number 20020009120
- Publication date Jan 24, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hiromitsu Sugimoto
- G01 - MEASURING TESTING

Shigehisa Yamamoto

Person

Patents Grantslast 30 patents

Silicon carbide epitaxial substrate and silicon carbide semiconduct...

Method for manufacturing silicon carbide semiconductor apparatus, a...

Method of verifying semiconductor integrated circuit reliability an...

Burn-in test method for a semiconductor chip and burn-in test appar...

Burn-in method and burn-in device

Method of testing semiconductor devices

Semiconductor device testing apparatus and testing method thereof

Design aiding apparatus and method for designing a semiconductor de...

Device for evaluating reliability of interconnect wires

Crystal orientation detectable semiconductor substrate, and methods...

Input protection circuit

Patents Applicationslast 30 patents

SEMICONDUCTOR MANUFACTURING APPARATUS

SILICON CARBIDE EPITAXIAL SUBSTRATE AND SILICON CARBIDE SEMICONDUCT...

METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR APPARATUS, A...

BURN-IN TEST METHOD FOR A SEMICONDUCTOR CHIP AND BURN-IN TEST APPAR...

BURN-IN METHOD AND BURN-IN DEVICE

Burn-in system and burn-in method