Shigekazu Aoki

Follow

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card, having cantilever-type probe and method
- Patent number 7,256,591
- Issue date Aug 14, 2007
- Fujitsu Limited
- Tsutomu Tatematsu
- G01 - MEASURING TESTING
Information Patent Grant
Self-testing circuit in semiconductor memory device
- Patent number 7,171,592
- Issue date Jan 30, 2007
- Fujitsu Limited
- Kenji Togashi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Self-testing circuit in semiconductor memory device
- Publication number 20030177415
- Publication date Sep 18, 2003
- FUJITSU LIMITED
- Kenji Togashi
- G11 - INFORMATION STORAGE
Information Patent Application
Probe card, semiconductor device testing apparatus, and probe conta...
- Publication number 20030098701
- Publication date May 29, 2003
- FUJITSU LIMITED
- Tsutomu Tatematsu
- G01 - MEASURING TESTING