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Shigeki Hoshino
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Minato-ku, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device for implementing signal transmission and/or po...
Patent number
7,906,846
Issue date
Mar 15, 2011
NEC Corporation
Shigeki Hoshino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device testing apparatus and power supply unit for se...
Patent number
7,852,101
Issue date
Dec 14, 2010
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field measuring apparatus capable of measuring at high spa...
Patent number
7,385,393
Issue date
Jun 10, 2008
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Grant
Electric and magnetic field detection device and electric and magne...
Patent number
6,844,725
Issue date
Jan 18, 2005
NEC Corporation
Shigeki Hoshino
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20090278246
Publication date
Nov 12, 2009
NEC CORPORATION
Shigeki Hoshino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Device Testing Apparatus and Power Supply Unit
Publication number
20080265933
Publication date
Oct 30, 2008
NEC Corporation
Michinobu Tanioka
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASURING APPARATUS CAPABLE OF MEASURING AT HIGH SPA...
Publication number
20080238419
Publication date
Oct 2, 2008
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field measuring apparatus capable of measuring at high spa...
Publication number
20050190358
Publication date
Sep 1, 2005
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field detection device and magnetic field measurement appa...
Publication number
20030076094
Publication date
Apr 24, 2003
NEC Corporation
Shigeki Hoshino
G01 - MEASURING TESTING
Information
Patent Application
Electric and magnetic field detection device and electric and magne...
Publication number
20030076092
Publication date
Apr 24, 2003
NEC Corporation
Shigeki Hoshino
G01 - MEASURING TESTING