Shigeki Iwanaga

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Palo Alto, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
Test chip, detection apparatus, and method for detecting analyte
- Publication number 20100112578
- Publication date May 6, 2010
- Sysmex Corporation
- Shigeki Iwanaga
- G01 - MEASURING TESTING
Information Patent Application
Method for detecting analyte, detection apparatus, and test chip
- Publication number 20100108539
- Publication date May 6, 2010
- Sysmex Corporation
- Shigeki Iwanaga
- G01 - MEASURING TESTING