SHIGEKI KATO

Person

TOCHIGI-KEN, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring apparatus, measuring method, and program
- Patent number 10,235,743
- Issue date Mar 19, 2019
- Canon Kabushiki Kaisha
- Takayuki Uozumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reflection characteristic measuring apparatus
- Patent number 9,528,934
- Issue date Dec 27, 2016
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer
- Patent number 9,372,066
- Issue date Jun 21, 2016
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Reflection characteristic measuring apparatus
- Patent number 8,976,361
- Issue date Mar 10, 2015
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Double pass interferometer with tilted mirrors
- Patent number 8,582,112
- Issue date Nov 12, 2013
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Double pass interferometer with tilted mirrors
- Patent number 8,384,910
- Issue date Feb 26, 2013
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Absolute position measurement apparatus
- Patent number 7,554,671
- Issue date Jun 30, 2009
- Canon Kabushiki Kaisha
- Hidejiro Kadowaki
- G01 - MEASURING TESTING
Information Patent Grant
Absolute position measurement apparatus
- Patent number 7,551,290
- Issue date Jun 23, 2009
- Canon Kabushiki Kaisha
- Hidejiro Kadowaki
- G01 - MEASURING TESTING
Information Patent Grant
Interference measuring apparatus for detecting a plurality of stabl...
- Patent number 7,375,820
- Issue date May 20, 2008
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Grant
Movement-direction determination apparatus
- Patent number 7,110,120
- Issue date Sep 19, 2006
- Canon Kabushiki Kaisha
- Kato Shigeki
- G01 - MEASURING TESTING
Information Patent Grant
Compact interference measuring apparatus for detecting the magnitud...
- Patent number 7,034,947
- Issue date Apr 25, 2006
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and position measuring device
- Patent number 6,914,682
- Issue date Jul 5, 2005
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Encoder
- Patent number 6,674,066
- Issue date Jan 6, 2004
- Canon Kabushiki Kaisha
- Yasushi Kaneda
- G01 - MEASURING TESTING
Information Patent Grant
Optical element used in compact interference measuring apparatus de...
- Patent number 6,657,181
- Issue date Dec 2, 2003
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Grant
Interference device, position detecting device, positioning device...
- Patent number 6,631,047
- Issue date Oct 7, 2003
- Canon Kabushiki Kaisha
- Kou Ishizuka
- G11 - INFORMATION STORAGE
Information Patent Grant
Displacement detecting apparatus and information recording apparatus
- Patent number 6,618,218
- Issue date Sep 9, 2003
- Canon Kabushiki Kaisha
- Hidejiro Kadowaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical interference apparatus and position detection apparatus
- Patent number 6,529,278
- Issue date Mar 4, 2003
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Interference device and position detection device using the same
- Patent number 6,493,170
- Issue date Dec 10, 2002
- Canon Kabushiki Kaisha
- Shigeki Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Interferometer which divides light beams into a plurality of beams...
- Patent number 6,473,184
- Issue date Oct 29, 2002
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus having an afocal lens system used in optical measurement...
- Patent number 5,926,276
- Issue date Jul 20, 1999
- Canon Kabushiki Kaisha
- Makoto Takamiya
- G01 - MEASURING TESTING
Information Patent Grant
Rotational displacement information detection apparatus
- Patent number 5,883,384
- Issue date Mar 16, 1999
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Displacement information measuring apparatus in which a light-recei...
- Patent number 5,815,267
- Issue date Sep 29, 1998
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Doppler velocimeter and various kinds of apparatuses for signal pro...
- Patent number 5,812,250
- Issue date Sep 22, 1998
- Canon Kabushiki Kaisha
- Yasuhiko Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Frequency shifter and optical displacement measuring apparatus usin...
- Patent number 5,796,470
- Issue date Aug 18, 1998
- Canon Kabushiki Kaisha
- Shinji Ueda
- G02 - OPTICS
Information Patent Grant
Optical device detecting displacement information using a device fo...
- Patent number 5,754,282
- Issue date May 19, 1998
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Frequency shifter and optical displacement measuring apparatus usin...
- Patent number 5,737,116
- Issue date Apr 7, 1998
- Canon Kabushiki Kaisha
- Hidejiro Kadowaki
- G02 - OPTICS
Information Patent Grant
Displacement information measuring apparatus
- Patent number 5,737,070
- Issue date Apr 7, 1998
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Frequency tracking method and apparatus, and Doppler velocity meter...
- Patent number 5,696,578
- Issue date Dec 9, 1997
- Canon Kabushiki Kaisha
- Yasuhiko Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus including a light-detecting element having a photo-electr...
- Patent number 5,657,125
- Issue date Aug 12, 1997
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Doppler velocimeter
- Patent number 5,552,879
- Issue date Sep 3, 1996
- Canon Kabushiki Kaisha
- Makoto Takamiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT DEVICE, MEASUREMENT METHOD, AND NON-TRANSITORY STORAGE...
- Publication number 20200408684
- Publication date Dec 31, 2020
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
REFLECTION CHARACTERISTIC MEASUREMENT APPARATUS, MACHINING SYSTEM,...
- Publication number 20190128806
- Publication date May 2, 2019
- Canon Kabushiki Kaisha
- Yusuke Kasai
- G05 - CONTROLLING REGULATING
Information Patent Application
MEASURING APPARATUS, MEASURING METHOD, AND PROGRAM
- Publication number 20160335772
- Publication date Nov 17, 2016
- Canon Kabushiki Kaisha
- Takayuki Uozumi
- G01 - MEASURING TESTING
Information Patent Application
REFLECTION CHARACTERISTIC MEASURING APPARATUS
- Publication number 20150153276
- Publication date Jun 4, 2015
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
REFLECTION CHARACTERISTIC MEASURING APPARATUS
- Publication number 20140176953
- Publication date Jun 26, 2014
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE PASS INTERFEROMETER WITH TILTED MIRRORS
- Publication number 20120327424
- Publication date Dec 27, 2012
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER
- Publication number 20110141479
- Publication date Jun 16, 2011
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER
- Publication number 20090284750
- Publication date Nov 19, 2009
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
Method for Inspecting Ceramic Structures
- Publication number 20080205596
- Publication date Aug 28, 2008
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY SYSTEM
- Publication number 20070103694
- Publication date May 10, 2007
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE MEASUREMENT APPARATUS
- Publication number 20070024862
- Publication date Feb 1, 2007
- Canon Kabushiki Kaisha
- Hidejiro Kadowaki
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE MEASUREMENT APPARATUS
- Publication number 20070024863
- Publication date Feb 1, 2007
- Canon Kabushiki Kaisha
- Hidejiro Kadowaki
- G01 - MEASURING TESTING
Information Patent Application
Interference measuring apparatus
- Publication number 20060114474
- Publication date Jun 1, 2006
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Application
Movement-direction determination apparatus
- Publication number 20040145749
- Publication date Jul 29, 2004
- Canon Kabushiki Kaisha
- Kato Shigeki
- G01 - MEASURING TESTING
Information Patent Application
Compact interference measuring apparatus detecting plurality of pha...
- Publication number 20030223075
- Publication date Dec 4, 2003
- Canon Kabushiki Kaisha
- Ko Ishizuka
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE DEVICE, POSITION DETECTING DEVICE, POSITIONING DEVICE...
- Publication number 20030133219
- Publication date Jul 17, 2003
- KOU ISHIZUKA
- G11 - INFORMATION STORAGE
Information Patent Application
Interferometer and position measuring device
- Publication number 20030081222
- Publication date May 1, 2003
- Canon Kabushiki Kaisha
- Shigeki Kato
- G01 - MEASURING TESTING
Information Patent Application
Optical interference apparatus and position detection apparatus
- Publication number 20020163647
- Publication date Nov 7, 2002
- Shigeki Kato
- G01 - MEASURING TESTING

SHIGEKI KATO

Person

Patents Grantslast 30 patents

Measuring apparatus, measuring method, and program

Reflection characteristic measuring apparatus

Interferometer

Reflection characteristic measuring apparatus

Double pass interferometer with tilted mirrors

Double pass interferometer with tilted mirrors

Absolute position measurement apparatus

Absolute position measurement apparatus

Interference measuring apparatus for detecting a plurality of stabl...

Movement-direction determination apparatus

Compact interference measuring apparatus for detecting the magnitud...

Interferometer and position measuring device

Encoder

Optical element used in compact interference measuring apparatus de...

Interference device, position detecting device, positioning device...

Displacement detecting apparatus and information recording apparatus

Optical interference apparatus and position detection apparatus

Interference device and position detection device using the same

Interferometer which divides light beams into a plurality of beams...

Apparatus having an afocal lens system used in optical measurement...

Rotational displacement information detection apparatus

Displacement information measuring apparatus in which a light-recei...

Doppler velocimeter and various kinds of apparatuses for signal pro...

Frequency shifter and optical displacement measuring apparatus usin...

Optical device detecting displacement information using a device fo...

Frequency shifter and optical displacement measuring apparatus usin...

Displacement information measuring apparatus

Frequency tracking method and apparatus, and Doppler velocity meter...

Apparatus including a light-detecting element having a photo-electr...

Doppler velocimeter

Patents Applicationslast 30 patents

MEASUREMENT DEVICE, MEASUREMENT METHOD, AND NON-TRANSITORY STORAGE...

REFLECTION CHARACTERISTIC MEASUREMENT APPARATUS, MACHINING SYSTEM,...

MEASURING APPARATUS, MEASURING METHOD, AND PROGRAM

REFLECTION CHARACTERISTIC MEASURING APPARATUS

REFLECTION CHARACTERISTIC MEASURING APPARATUS

DOUBLE PASS INTERFEROMETER WITH TILTED MIRRORS

INTERFEROMETER

INTERFEROMETER

Method for Inspecting Ceramic Structures

INTERFEROMETRY SYSTEM

INTERFERENCE MEASUREMENT APPARATUS

INTERFERENCE MEASUREMENT APPARATUS

Interference measuring apparatus

Movement-direction determination apparatus

Compact interference measuring apparatus detecting plurality of pha...

INTERFERENCE DEVICE, POSITION DETECTING DEVICE, POSITIONING DEVICE...

Interferometer and position measuring device

Optical interference apparatus and position detection apparatus