Shigeki Kobayashi

Person

Shiga, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Perspective viewing inspection system
- Patent number 6,771,805
- Issue date Aug 3, 2004
- Keiso Research Laboratories, Inc.
- Shigeki Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection supporting apparatus and printed circuit board in...
- Patent number 6,362,877
- Issue date Mar 26, 2002
- Omron Corporation
- Shigeki Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Pair of foldaway orthogonal mirrors and fabrication method thereof
- Patent number 6,322,222
- Issue date Nov 27, 2001
- Shigeki Kobayashi
- G02 - OPTICS
Information Patent Grant
Teaching method and system for mounted component inspection
- Patent number 5,822,449
- Issue date Oct 13, 1998
- Omron Corporation
- Shigeki Kobayashi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automatic soldering apparatus, apparatus and method for teaching sa...
- Patent number 5,542,600
- Issue date Aug 6, 1996
- Omron Corporation
- Shigeki Kobayashi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for inspecting printed circuit boards and the like, and m...
- Patent number 5,245,671
- Issue date Sep 14, 1993
- Omron Corporation
- Shigeki Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting packaged electronic device
- Patent number 5,093,797
- Issue date Mar 3, 1992
- Omron Tateisi Electronics Co.
- Teruhisa Yotsuya
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for inspecting printed circuit boards and t...
- Patent number 5,039,868
- Issue date Aug 13, 1991
- Omron Corporation
- Shigeki Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for inspecting printed circuit boards
- Patent number 5,032,735
- Issue date Jul 16, 1991
- Omron Corporation
- Shigeki Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Operator selectable multiple mode spectrophotometer
- Patent number 4,568,186
- Issue date Feb 4, 1986
- Omron Tateisi Electronics Co.
- Manabu Yoshimura
- G01 - MEASURING TESTING
Information Patent Grant
Blood cell identification and classification system
- Patent number 4,404,683
- Issue date Sep 13, 1983
- Omron Tateisi Electronics Co.
- Shigeki Kobayashi
- G06 - COMPUTING CALCULATING COUNTING

Shigeki Kobayashi

Person

Patents Grantslast 30 patents

Perspective viewing inspection system

Visual inspection supporting apparatus and printed circuit board in...

Pair of foldaway orthogonal mirrors and fabrication method thereof

Teaching method and system for mounted component inspection

Automatic soldering apparatus, apparatus and method for teaching sa...

Apparatus for inspecting printed circuit boards and the like, and m...

Apparatus for inspecting packaged electronic device

Method of and apparatus for inspecting printed circuit boards and t...

Method of and apparatus for inspecting printed circuit boards

Operator selectable multiple mode spectrophotometer

Blood cell identification and classification system