Shigeki Kurihara

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Defect image processing apparatus, defect image processing method,...
- Patent number 8,995,748
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation object pattern determining apparatus, evaluation object...
- Patent number 8,139,845
- Issue date Mar 20, 2012
- Hitachi High-Technologies Corporation
- Takashi Noguchi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...
- Publication number 20120141011
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEFECT INTEGRATED PROJECTION METHOD AND DEFECT INSPEC...
- Publication number 20110296362
- Publication date Dec 1, 2011
- Tamao Ishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATION OBJECT PATTERN DETERMINING APPARATUS, EVALUATION OBJECT...
- Publication number 20090110262
- Publication date Apr 30, 2009
- Takashi Noguchi
- G06 - COMPUTING CALCULATING COUNTING