Shigeki NISHINA

Person

Miyagi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional laminating and shaping apparatus and laminating a...
- Patent number 11,229,971
- Issue date Jan 25, 2022
- Advantest Corporation
- Shinji Sugatani
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Three-dimensional laminating and shaping apparatus and laminating a...
- Patent number 10,919,105
- Issue date Feb 16, 2021
- Advantest Corporation
- Shinji Sugatani
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 9,176,008
- Issue date Nov 3, 2015
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Carrier and adhesion amount measuring apparatus, and measuring meth...
- Patent number 8,969,807
- Issue date Mar 3, 2015
- Advantest Corporation
- Motoki Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,493,057
- Issue date Jul 23, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,481,938
- Issue date Jul 9, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Container, a method for disposing the same, and a measurement method
- Patent number 8,378,703
- Issue date Feb 19, 2013
- Advantest Corporation
- Akiyoshi Irisawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Container, container positioning method, and measuring method
- Patent number 8,330,110
- Issue date Dec 11, 2012
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Collection medium and collection amount measuring apparatus, and me...
- Patent number 8,210,035
- Issue date Jul 3, 2012
- Advantest Corporation
- Motoki Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measurement method, a pro...
- Patent number 8,183,528
- Issue date May 22, 2012
- Advantest Corporation
- Eiji Kato
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus
- Patent number 8,053,733
- Issue date Nov 8, 2011
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Optical sampling apparatus
- Patent number 7,760,344
- Issue date Jul 20, 2010
- Advantest Corp.
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Monochromator and spectrometric method
- Patent number 6,411,382
- Issue date Jun 25, 2002
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Light-measuring device for accurate and continuous measurement of l...
- Patent number 5,969,809
- Issue date Oct 19, 1999
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Michelson interferometer including a non-polarizing beam splitter
- Patent number 5,867,271
- Issue date Feb 2, 1999
- Advantest Corporation
- Isao Tokumoto
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measuring device eliminating polarization dependency
- Patent number 5,657,121
- Issue date Aug 12, 1997
- Advantest Corporation
- Shigeki Nishina
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL LAMINATING AND SHAPING APPARATUS AND LAMINATING A...
- Publication number 20190118287
- Publication date Apr 25, 2019
- Advantest Corporation
- Shinji SUGATANI
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
THREE-DIMENSIONAL LAMINATING AND SHAPING APPARATUS AND LAMINATING A...
- Publication number 20190118286
- Publication date Apr 25, 2019
- ADVANTEST CORPORATION
- Shinji SUGATANI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20130240736
- Publication date Sep 19, 2013
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METH...
- Publication number 20130075612
- Publication date Mar 28, 2013
- Advantest Corporation
- Motoki IMAMURA
- G01 - MEASURING TESTING
Information Patent Application
CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METH...
- Publication number 20110097649
- Publication date Apr 28, 2011
- Advantest Corporation
- Motoki IMAMURA
- G01 - MEASURING TESTING
Information Patent Application
COLLECTION MEDIUM AND COLLECTION AMOUNT MEASURING APPARATUS, AND ME...
- Publication number 20110094300
- Publication date Apr 28, 2011
- Advantest Corporation
- Motoki IMAMURA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS
- Publication number 20110075127
- Publication date Mar 31, 2011
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER, CONTAINER POSITIONING METHOD, AND MEASURING METHOD
- Publication number 20110057103
- Publication date Mar 10, 2011
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20110001048
- Publication date Jan 6, 2011
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
HOLDING FIXTURE, PLACEMENT METHOD OF HOLDING FIXTURE, AND MEASUREME...
- Publication number 20100321682
- Publication date Dec 23, 2010
- Advantest Corporation
- Eiji KATO
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20100295534
- Publication date Nov 25, 2010
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PRO...
- Publication number 20100271001
- Publication date Oct 28, 2010
- Advantest Corporation
- Eiji KATO
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER, A METHOD FOR DISPOSING THE SAME, AND A MEASUREMENT METHOD
- Publication number 20100271056
- Publication date Oct 28, 2010
- Advantest Corporation
- Akiyoshi IRISAWA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL SAMPLING APPARATUS
- Publication number 20090051918
- Publication date Feb 26, 2009
- Advantest Corporation
- Shigeki NISHINA
- G02 - OPTICS

Shigeki NISHINA

Person

Patents Grantslast 30 patents

Three-dimensional laminating and shaping apparatus and laminating a...

Three-dimensional laminating and shaping apparatus and laminating a...

Electromagnetic wave measuring apparatus, measuring method, program...

Carrier and adhesion amount measuring apparatus, and measuring meth...

Electromagnetic wave measuring apparatus, measuring method, program...

Electromagnetic wave measuring apparatus, measuring method, program...

Container, a method for disposing the same, and a measurement method

Container, container positioning method, and measuring method

Collection medium and collection amount measuring apparatus, and me...

Electromagnetic wave measuring apparatus, measurement method, a pro...

Electromagnetic wave measuring apparatus

Optical sampling apparatus

Monochromator and spectrometric method

Light-measuring device for accurate and continuous measurement of l...

Michelson interferometer including a non-polarizing beam splitter

Spectrum measuring device eliminating polarization dependency

Patents Applicationslast 30 patents

THREE-DIMENSIONAL LAMINATING AND SHAPING APPARATUS AND LAMINATING A...

THREE-DIMENSIONAL LAMINATING AND SHAPING APPARATUS AND LAMINATING A...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METH...

CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METH...

COLLECTION MEDIUM AND COLLECTION AMOUNT MEASURING APPARATUS, AND ME...

ELECTROMAGNETIC WAVE MEASURING APPARATUS

CONTAINER, CONTAINER POSITIONING METHOD, AND MEASURING METHOD

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

HOLDING FIXTURE, PLACEMENT METHOD OF HOLDING FIXTURE, AND MEASUREME...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PRO...

CONTAINER, A METHOD FOR DISPOSING THE SAME, AND A MEASUREMENT METHOD

OPTICAL SAMPLING APPARATUS