Shigeki Takizawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test equipment
- Patent number 7,876,118
- Issue date Jan 25, 2011
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and calibration method
- Patent number 7,802,160
- Issue date Sep 21, 2010
- Advantest Corporation
- Shigeki Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Interconnection substrate, skew measurement method, and test apparatus
- Patent number 7,768,255
- Issue date Aug 3, 2010
- Advantest Corporation
- Shigeki Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, correction value managing method, and computer program
- Patent number 7,350,123
- Issue date Mar 25, 2008
- Advantest Corporation
- Shigeki Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system having high frequency and low jitter cloc...
- Patent number 6,275,057
- Issue date Aug 14, 2001
- Advantest Corp.
- Shigeki Takizawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST EQUIPMENT AND TEST METHOD
- Publication number 20100194421
- Publication date Aug 5, 2010
- Advantest Corporation
- SATOSHI IWAMOTO
- G01 - MEASURING TESTING
Information Patent Application
INTERCONNECTION SUBSTRATE, SKEW MEASUREMENT METHOD, AND TEST APPARATUS
- Publication number 20100052723
- Publication date Mar 4, 2010
- Advantest Corporation
- Shigeki Takizawa
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND CALIBRATION METHOD
- Publication number 20090150733
- Publication date Jun 11, 2009
- Advantest Corporation
- Shigeki Takizawa
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus, correction value managing method, and computer program
- Publication number 20050034043
- Publication date Feb 10, 2005
- Advantest Corporation
- Shigeki Takizawa
- G01 - MEASURING TESTING