Membership
Tour
Register
Log in
Shigeki YAMAGUCHI
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Sample container gripping apparatus, sample conveyance apparatus, a...
Patent number
12,222,359
Issue date
Feb 11, 2025
HITACHI HIGH-TECH CORPORATION
Taichiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Sample discrimination system and sample automatic processing appara...
Patent number
12,123,885
Issue date
Oct 22, 2024
HITACHI HIGH-TECH CORPORATION
Tooru Miyasaka
G01 - MEASURING TESTING
Information
Patent Grant
Connection device and specimen inspection automating system provide...
Patent number
12,078,649
Issue date
Sep 3, 2024
HITACHI HIGH-TECH CORPORATION
Shigeki Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Specimen carrier
Patent number
12,038,452
Issue date
Jul 16, 2024
HITACHI HIGH-TECH CORPORATION
Shigeki Yamaguchi
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Sample test automation system
Patent number
11,360,110
Issue date
Jun 14, 2022
HITACHI HIGH-TECH CORPORATION
Shigeki Yamaguchi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Inspection device
Patent number
10,768,186
Issue date
Sep 8, 2020
HITACHI HIGH-TECH CORPORATION
Eiji Takaya
G01 - MEASURING TESTING
Information
Patent Grant
Specimen inspection automation system
Patent number
10,684,302
Issue date
Jun 16, 2020
HITACHI HIGH-TECH CORPORATION
Shigeki Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Particle suction capture mechanism and unstopping device equipped w...
Patent number
10,604,393
Issue date
Mar 31, 2020
Hitachi High-Technologies Corporation
Hideo Enoki
B67 - OPENING, CLOSING OR CLEANING BOTTLES, JARS OR SIMILAR CONTAINERS LIQUID...
Information
Patent Grant
Plug application and removal device and sample processing device
Patent number
9,630,181
Issue date
Apr 25, 2017
Hitachi High-Technologies Corporation
Yoshihiro Nagaoka
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Automatic analysis system
Patent number
9,535,081
Issue date
Jan 3, 2017
Hitachi High-Technologies Corporation
Toshiki Yamagata
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Cap opening and closing mechanism and automatic analyzer including...
Patent number
9,505,507
Issue date
Nov 29, 2016
Hitachi High-Technologies Corporation
Toshiki Yamagata
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Laboratory automation apparatus, automated analytical apparatus and...
Patent number
9,390,597
Issue date
Jul 12, 2016
Hitachi High-Technologies Corporation
Shigeki Yamaguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Connection Device and Automated System for Inspecting Specimen
Publication number
20240142479
Publication date
May 2, 2024
Hitachi High-Tech Corporation
Shigeki YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE TRANSPORT DEVICE AND SAMPLE TRANSPORT CARRIER
Publication number
20230202779
Publication date
Jun 29, 2023
HITACHI HIGH-TECH CORPORATION
Takeshi MATSUKA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TRANSPORT APPARATUS
Publication number
20220413000
Publication date
Dec 29, 2022
HITACHI HIGH-TECH CORPORATION
Kazuma TAMURA
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Application
SAMPLE CONTAINER GRIPPING APPARATUS, SAMPLE CONVEYANCE APPARATUS, A...
Publication number
20220357354
Publication date
Nov 10, 2022
HITACHI HIGH-TECH CORPORATION
Taichiro YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE DISCRIMINATION SYSTEM AND SAMPLE AUTOMATIC PROCESSING APPARA...
Publication number
20210373041
Publication date
Dec 2, 2021
HITACHI HIGH-TECH CORPORATION
Tooru MIYASAKA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN CARRIER
Publication number
20210356485
Publication date
Nov 18, 2021
HITACHI HIGH-TECH CORPORATION
Shigeki YAMAGUCHI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
CONNECTION DEVICE AND SPECIMEN INSPECTION AUTOMATING SYSTEM PROVIDE...
Publication number
20210215730
Publication date
Jul 15, 2021
HITACHI HIGH-TECH CORPORATION
Shigeki YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Sample Test Automation System
Publication number
20190265261
Publication date
Aug 29, 2019
Hitachi High-Technologies Corporation
Shigeki YAMAGUCHI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM
Publication number
20180246131
Publication date
Aug 30, 2018
Hitachi High-Technologies Corporation
Shigeki YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Inspection Device
Publication number
20180052183
Publication date
Feb 22, 2018
Hitachi High-Technologies Corporation
Eiji TAKAYA
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE SUCTION CAPTURE MECHANISM AND UNSTOPPING DEVICE EQUIPPED W...
Publication number
20170166428
Publication date
Jun 15, 2017
Hitachi High-Technologies Corporation
Hideo ENOKI
B08 - CLEANING
Information
Patent Application
AUTOMATIC ANALYSIS SYSTEM
Publication number
20140314623
Publication date
Oct 23, 2014
Hitachi High-Technologies Corporation
Toshiki Yamagata
G01 - MEASURING TESTING
Information
Patent Application
PLUG APPLICATION AND REMOVAL DEVICE AND SAMPLE PROCESSING DEVICE
Publication number
20140212344
Publication date
Jul 31, 2014
Hitachi High-Technologies Corporation
Yoshihiro Nagaoka
G01 - MEASURING TESTING
Information
Patent Application
CAP OPENING AND CLOSING MECHANISM AND AUTOMATIC ANALYZER INCLUDING...
Publication number
20140174028
Publication date
Jun 26, 2014
Hitachi High-Technologies Corporation
Toshiki Yamagata
G01 - MEASURING TESTING
Information
Patent Application
LABORATORY AUTOMATION APPARATUS, AUTOMATED ANALYTICAL APPARATUS AND...
Publication number
20130201019
Publication date
Aug 8, 2013
Hitachi High-Technologies Corporation
Shigeki Yamaguchi
G01 - MEASURING TESTING