SHIGEMI KOMAGATA

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TOKYO, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus, probe card, and test method
- Patent number 7,755,375
- Issue date Jul 13, 2010
- Advantest Corporation
- Yuji Ariyama
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating output levels of a waveform analyzing apparatus
- Patent number 5,138,267
- Issue date Aug 11, 1992
- Advantest Corporation
- Shigemi Komagata
- G01 - MEASURING TESTING
Information Patent Grant
AC evaluation equipment for an IC tester
- Patent number 5,059,893
- Issue date Oct 22, 1991
- Advantest Corporation
- Masahisa Hiral
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS, PROBE CARD, AND TEST METHOD
- Publication number 20090174420
- Publication date Jul 9, 2009
- Advantest Corporation
- YUJI ARIYAMA
- G01 - MEASURING TESTING