Shigemitsu Seitoh

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Hachioji, JP

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Patents Grantslast 30 patents

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Magnetic field measurement optimization apparatus using a charged p...
- Patent number 5,111,141
- Issue date May 5, 1992
- Hitachi, Ltd.
- Satoru Fukuhara
- G01 - MEASURING TESTING
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Voltage measurement method using electron beam
- Patent number 5,093,616
- Issue date Mar 3, 1992
- Hitachi, Ltd.
- Shigemitsu Seitoh
- G01 - MEASURING TESTING
Information Patent Grant
Potential measurement device
- Patent number 4,922,097
- Issue date May 1, 1990
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
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Apparatus for focusing a charged particle beam onto a specimen
- Patent number 4,605,860
- Issue date Aug 12, 1986
- Hitachi, Ltd.
- Satoru Fukuhara
- H01 - BASIC ELECTRIC ELEMENTS