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Shigenori Kuroda
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Superconductive magnet device
Patent number
6,861,933
Issue date
Mar 1, 2005
Mitsubishi Denki Kabushiki Kaisha
Naoji Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Open-type magnet device for MRI
Patent number
6,856,223
Issue date
Feb 15, 2005
Hitachi Medical Corporation
Hirotaka Takeshima
G01 - MEASURING TESTING
Information
Patent Grant
Superconductive magnet device
Patent number
6,847,279
Issue date
Jan 25, 2005
Mitsubishi Denki Kabushiki Kaisha
Naoji Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting magnetic apparatus
Patent number
6,781,492
Issue date
Aug 24, 2004
Hitachi Medical Corporation
Hirotaka Takeshima
G01 - MEASURING TESTING
Information
Patent Grant
Superconductive magnet device
Patent number
6,707,359
Issue date
Mar 16, 2004
Mitsubishi Denki Kabushiki Kaisha
Naoji Yoshida
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting magnetic device
Patent number
6,437,672
Issue date
Aug 20, 2002
Hitachi Medical Corporation
Hirotaka Takeshima
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field compensating apparatus
Patent number
4,945,446
Issue date
Jul 31, 1990
Mitsubishi Denki Kabushiki Kaisha
Shigenori Kuroda
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnet having magnetic shield
Patent number
4,800,355
Issue date
Jan 24, 1989
Mitsubishi Denki Kabushiki Kaisha
Moriaki Takechi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Superconductive magnet device
Publication number
20040051613
Publication date
Mar 18, 2004
Mitsubishi Denki Kabushiki Kaisha
Naoji Yoshida
G01 - MEASURING TESTING
Information
Patent Application
Superconductive magnet device
Publication number
20030011456
Publication date
Jan 16, 2003
Mitsubishi Denki Kabushiki Kaisha
Naoji Yoshida
G01 - MEASURING TESTING
Information
Patent Application
Superconducting magnet apparatus
Publication number
20020180571
Publication date
Dec 5, 2002
Hirotaka Takeshima
G01 - MEASURING TESTING