Shigenori Nagano

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Nondestructive test system comprising a neutron emission unit for e...
- Patent number 11,754,516
- Issue date Sep 12, 2023
- Topcon Corporation
- Hisashi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive inspection system comprising neutron radiation sour...
- Patent number 11,747,288
- Issue date Sep 5, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive testing system and nondestructive testing method
- Patent number 11,614,415
- Issue date Mar 28, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspecting system, and nondestructive inspecting method
- Patent number 11,513,084
- Issue date Nov 29, 2022
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Electronic distance meter
- Patent number 9,995,826
- Issue date Jun 12, 2018
- Kabushiki Kaisha Topcon
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Laser light emitting device having a mode scrambler for unifying li...
- Patent number 9,709,676
- Issue date Jul 18, 2017
- Kabushiki Kaisha Topcon
- Taizo Eno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical branching device
- Patent number 7,561,768
- Issue date Jul 14, 2009
- Kabushiki Kaisha Topcon
- Akira Takada
- G02 - OPTICS
Information Patent Grant
Optical fiber cable
- Patent number 7,309,168
- Issue date Dec 18, 2007
- Kabushiki Kaisha Topcon
- Masayuki Momiuchi
- G02 - OPTICS
Information Patent Grant
Interference measurement apparatus and probe used for interference...
- Patent number 6,233,370
- Issue date May 15, 2001
- Kabushiki Kaisha Topcon
- Makoto Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Interference measurement apparatus, interference measurement probe...
- Patent number 6,166,818
- Issue date Dec 26, 2000
- Kabushiki Kaisha Topcon
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Signal formation apparatus for use in interference measurement
- Patent number 6,075,600
- Issue date Jun 13, 2000
- Kabushiki Kaisha Topcon
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring cross-sectional distribution of refractive...
- Patent number 5,349,431
- Issue date Sep 20, 1994
- Kabushiki Kaisha Topcon
- Nicolas Gisin
- G01 - MEASURING TESTING
Information Patent Grant
Method for patterning an optical device for optical IC, and an opti...
- Patent number 5,337,169
- Issue date Aug 9, 1994
- Kabushiki Kaisha Topcon
- Nobuo Hori
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
- Publication number 20240272102
- Publication date Aug 15, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION SYSTEM
- Publication number 20240192153
- Publication date Jun 13, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE
- Publication number 20240183801
- Publication date Jun 6, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE TEST SYSTEM AND NONDESTRUCTIVE TEST METHOD
- Publication number 20220128489
- Publication date Apr 28, 2022
- TOPCON CORPORATION
- Hisashi TSUKADA
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE TESTING SYSTEM AND NONDESTRUCTIVE TESTING METHOD
- Publication number 20220082514
- Publication date Mar 17, 2022
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING SYSTEM, AND NONDESTRUCTIVE INSPECTING METHOD
- Publication number 20220003690
- Publication date Jan 6, 2022
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...
- Publication number 20210396688
- Publication date Dec 23, 2021
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
Laser Light Emitting Device And Laser Surveying Instrument
- Publication number 20160036193
- Publication date Feb 4, 2016
- Kabushiki Kaisha TOPCON
- Taizo Eno
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DISTANCE METER
- Publication number 20150378021
- Publication date Dec 31, 2015
- KABUSHIKI KAISHA TOPCON
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL BRANCHING DEVICE
- Publication number 20080219679
- Publication date Sep 11, 2008
- Akira Takada
- G02 - OPTICS
Information Patent Application
Optical fiber cable
- Publication number 20070147742
- Publication date Jun 28, 2007
- Kabushiki Kaisha TOPCON
- Masayuki Momiuchi
- G02 - OPTICS
Information Patent Application
Card true/false decision apparatus
- Publication number 20040031849
- Publication date Feb 19, 2004
- Nobuo Hori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Card true/false decision apparatus
- Publication number 20040016810
- Publication date Jan 29, 2004
- Nobuo Hori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Card genuine judging apparatus and card genuine judging system
- Publication number 20020131597
- Publication date Sep 19, 2002
- Nobuo Hori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Interference measurement apparatus and probe used for interference...
- Publication number 20010014191
- Publication date Aug 16, 2001
- Makoto Fujino
- G01 - MEASURING TESTING

Shigenori Nagano

Person

Patents Grantslast 30 patents

Nondestructive test system comprising a neutron emission unit for e...

Non-destructive inspection system comprising neutron radiation sour...

Nondestructive testing system and nondestructive testing method

Nondestructive inspecting system, and nondestructive inspecting method

Electronic distance meter

Laser light emitting device having a mode scrambler for unifying li...

Optical branching device

Optical fiber cable

Interference measurement apparatus and probe used for interference...

Interference measurement apparatus, interference measurement probe...

Signal formation apparatus for use in interference measurement

Apparatus for measuring cross-sectional distribution of refractive...

Method for patterning an optical device for optical IC, and an opti...

Patents Applicationslast 30 patents

NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...

NONDESTRUCTIVE INSPECTION SYSTEM

NONDESTRUCTIVE INSPECTING DEVICE

NONDESTRUCTIVE TEST SYSTEM AND NONDESTRUCTIVE TEST METHOD

NONDESTRUCTIVE TESTING SYSTEM AND NONDESTRUCTIVE TESTING METHOD

NONDESTRUCTIVE INSPECTING SYSTEM, AND NONDESTRUCTIVE INSPECTING METHOD

NONDESTRUCTIVE INSPECTING SYSTEM, NEUTRON RADIATION SOURCE, AND NEU...

Laser Light Emitting Device And Laser Surveying Instrument

ELECTRONIC DISTANCE METER

OPTICAL BRANCHING DEVICE

Optical fiber cable

Card true/false decision apparatus

Card true/false decision apparatus

Card genuine judging apparatus and card genuine judging system

Interference measurement apparatus and probe used for interference...