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Shigenori Tsuji
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Triaxial magnetic field correction coil, physics package, physics p...
Patent number
11,929,754
Issue date
Mar 12, 2024
Jeol Ltd.
Shigenori Tsuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical lattice clock and magnetic field correction method for opti...
Patent number
11,894,854
Issue date
Feb 6, 2024
Jeol Ltd.
Shigenori Tsuji
G04 - HOROLOGY
Information
Patent Grant
NMR probe
Patent number
10,775,456
Issue date
Sep 15, 2020
Jeol Ltd.
Katsuyuki Toshima
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance signal detection module
Patent number
10,705,164
Issue date
Jul 7, 2020
Jeol Ltd.
Fumio Hobo
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing detection coil for magnetic resonance meas...
Patent number
10,571,533
Issue date
Feb 25, 2020
Jeol Ltd.
Shigetoshi Oshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing detection coil for magnetic resonance meas...
Patent number
10,539,634
Issue date
Jan 21, 2020
Jeol Ltd.
Shigetoshi Oshima
G01 - MEASURING TESTING
Information
Patent Grant
NMR measuring probe
Patent number
10,114,089
Issue date
Oct 30, 2018
Jeol Ltd.
Katsuyuki Toshima
G01 - MEASURING TESTING
Information
Patent Grant
Device for attaching and detaching NMR probe
Patent number
10,073,153
Issue date
Sep 11, 2018
Jeol Ltd.
Masanori Hirose
G01 - MEASURING TESTING
Information
Patent Grant
NMR spectrometer and method of setting up the same
Patent number
9,494,663
Issue date
Nov 15, 2016
Jeol Ltd.
Shigenori Tsuji
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance force microscope
Patent number
7,400,144
Issue date
Jul 15, 2008
Jeol Ltd.
Shigenori Tsuji
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Slow Atomic Beam Generator, Physical Package, Physical Package For...
Publication number
20240187009
Publication date
Jun 6, 2024
JEOL Ltd.
Shigenori Tsuji
G04 - HOROLOGY
Information
Patent Application
Slow Atomic Beam Generator, Physical Package, Physical Package for...
Publication number
20240114611
Publication date
Apr 4, 2024
JEOL Ltd.
Shigenori Tsuji
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Physical Package for Optical Lattice Clock
Publication number
20230229115
Publication date
Jul 20, 2023
JEOL Ltd.
Shigenori Tsuji
G04 - HOROLOGY
Information
Patent Application
Optical Lattice Clock and Magnetic Field Correction Method for Opti...
Publication number
20230216513
Publication date
Jul 6, 2023
JEOL Ltd.
Shigenori Tsuji
G04 - HOROLOGY
Information
Patent Application
Triaxial Magnetic Field Correction Coil, Physics Package, Physics P...
Publication number
20230134841
Publication date
May 4, 2023
JEOL Ltd.
Shigenori Tsuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tri-Axial Magnetic Field Correction Coil, Physical Package, Physica...
Publication number
20230120920
Publication date
Apr 20, 2023
JEOL Ltd.
Shigenori Tsuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NMR Probe
Publication number
20190331747
Publication date
Oct 31, 2019
JEOL Ltd.
Katsuyuki Toshima
G01 - MEASURING TESTING
Information
Patent Application
Method for Manufacturing Detection Coil for Magnetic Resonance Meas...
Publication number
20180024207
Publication date
Jan 25, 2018
JEOL Ltd.
Shigetoshi Oshima
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Resonance Signal Detection Module
Publication number
20170336485
Publication date
Nov 23, 2017
JEOL Ltd.
Fumio Hobo
G01 - MEASURING TESTING
Information
Patent Application
NMR Measuring Probe
Publication number
20170205479
Publication date
Jul 20, 2017
JEOL Ltd.
Katsuyuki Toshima
G01 - MEASURING TESTING
Information
Patent Application
Device for Attaching and Detaching NMR Probe
Publication number
20150168518
Publication date
Jun 18, 2015
JEOL Ltd.
Masanori Hirose
G01 - MEASURING TESTING
Information
Patent Application
NMR Spectrometer and Method of Setting Up the Same
Publication number
20130178367
Publication date
Jul 11, 2013
JEOL RESONANCE INC.
Shigenori Tsuji
G01 - MEASURING TESTING
Information
Patent Application
Magnetic resonance force microscope
Publication number
20070216412
Publication date
Sep 20, 2007
JEOL Ltd.
Shigenori Tsuji
G01 - MEASURING TESTING