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Shigenori WATARI

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
    • Publication number 20140147348
    • Publication date May 29, 2014
    • Hitachi High-Technologies Corporation
    • Hajime KATOU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20100288830
    • Publication date Nov 18, 2010
    • Hitachi High-Technologies Corporation
    • Shigenori Watari
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
    • Publication number 20100233027
    • Publication date Sep 16, 2010
    • Hajime Katou
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYZER AND THE ANALYZING METHOD USING THE SAME
    • Publication number 20080213903
    • Publication date Sep 4, 2008
    • Katsuhiro KAMBARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20080213132
    • Publication date Sep 4, 2008
    • Shigenori Watari
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE TRANSPORT RACK
    • Publication number 20080063563
    • Publication date Mar 13, 2008
    • Shigenori WATARI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic analyzer
    • Publication number 20070181787
    • Publication date Aug 9, 2007
    • Kenichi Nishigaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Chemical analysis apparatus and chemical analysis method
    • Publication number 20070009387
    • Publication date Jan 11, 2007
    • Hajime Katou
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040258565
    • Publication date Dec 23, 2004
    • Shigenori Watari
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040076545
    • Publication date Apr 22, 2004
    • Hitachi, Ltd.
    • Shigenori Watari
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Chemical analysis apparatus and chemical analysis method
    • Publication number 20030166260
    • Publication date Sep 4, 2003
    • Hajime Katou
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Apparatus for automatically detecting size to be detected and autom...
    • Publication number 20020134923
    • Publication date Sep 26, 2002
    • Shigenori Watari
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analysis apparatus
    • Publication number 20020025579
    • Publication date Feb 28, 2002
    • Masaaki Odakura
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic analyzer
    • Publication number 20010019702
    • Publication date Sep 6, 2001
    • Shigenori Watari
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL