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Shigeo Tohyama
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Katsuta, JP
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last 30 patents
Information
Patent Grant
Photoelastic effect measuring device
Patent number
4,810,089
Issue date
Mar 7, 1989
Hitachi, Ltd.
Takeo Murakoshi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring photoelasticity
Patent number
4,786,802
Issue date
Nov 22, 1988
Hitachi, Ltd.
Masaki Yoshii
G01 - MEASURING TESTING
Information
Patent Grant
Recording apparatus for a spectrophotometer
Patent number
4,566,793
Issue date
Jan 28, 1986
Hitachi, Ltd.
Shigeo Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Calibrating apparatus in a monochromator
Patent number
4,352,561
Issue date
Oct 5, 1982
Hitachi, Ltd.
Shigeo Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Slit width calibrator for monochromator
Patent number
4,325,634
Issue date
Apr 20, 1982
Hitachi, Ltd.
Shigeo Tohyama
G01 - MEASURING TESTING
Information
Patent Grant
Spectro-photometer with arithmetic and control unit
Patent number
4,323,309
Issue date
Apr 6, 1982
Hitachi, Ltd.
Nobuo Akitomo
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometer
Patent number
4,304,490
Issue date
Dec 8, 1981
Hitachi, Ltd.
Takeo Murakoshi
G01 - MEASURING TESTING
Information
Patent Grant
Recording system with inter-line space positioning means
Patent number
4,283,732
Issue date
Aug 11, 1981
Hitachi, Ltd.
Nobuo Akitomo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectrophotometer
Patent number
4,227,811
Issue date
Oct 14, 1980
Hitachi, Ltd.
Shigeo Tohyama
G01 - MEASURING TESTING