Shigeoki Mori

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Ayase, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe device
- Patent number 5,642,432
- Issue date Jun 24, 1997
- Tokyo Electron Limited
- Shigeoki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus for measuring electrical characteristics of objects
- Patent number 5,416,592
- Issue date May 16, 1995
- Tokyo Electron Kabushiki Kaisha
- Shigeoki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus with a swinging holder for an object of examination
- Patent number 5,404,111
- Issue date Apr 4, 1995
- Tokyo Electron Limited
- Shigeoki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus for probing an object held above the probe card
- Patent number 5,321,453
- Issue date Jun 14, 1994
- Tokyo Electron Limited
- Shigeoki Mori
- G01 - MEASURING TESTING