Shigeru EURA

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Ultrasonic testing device and ultrasonic testing method
- Patent number 12,153,021
- Issue date Nov 26, 2024
- National University Corporation Toyohashi University of Technology
- Naohiro Hozumi
- G01 - MEASURING TESTING
Information Patent Grant
Orientation characteristic measurement method, orientation characte...
- Patent number 11,920,921
- Issue date Mar 5, 2024
- Hamamatsu Photonics K.K.
- Kiyotada Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Light measurement device and light measurement method
- Patent number 11,703,389
- Issue date Jul 18, 2023
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Light measurement device and light measurement method
- Patent number 11,346,720
- Issue date May 31, 2022
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Orientation characteristic measurement method, orientation characte...
- Patent number 11,243,073
- Issue date Feb 8, 2022
- Hamamatsu Photonics K.K.
- Kiyotada Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device and spectrometry method
- Patent number 10,816,402
- Issue date Oct 27, 2020
- Hamamatsu Photonics K.K.
- Kenichiro Ikemura
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measuring device, spectrum measuring method, and specimen...
- Patent number 10,209,189
- Issue date Feb 19, 2019
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and optical measurement method
- Patent number 10,094,779
- Issue date Oct 9, 2018
- Hamamatsu Photonics K.K.
- Shigeru Eura
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measuring device and spectrum measuring method
- Patent number 9,423,339
- Issue date Aug 23, 2016
- Hamamatsu Photonics K.K.
- Shigeru Eura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20230184827
- Publication date Jun 15, 2023
- Hamamatsu Photonics K.K.
- Norimichi CHINONE
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC TESTING DEVICE AND ULTRASONIC TESTING METHOD
- Publication number 20220163485
- Publication date May 26, 2022
- National University Corporation Toyohashi University of Technology
- Naohiro HOZUMI
- G01 - MEASURING TESTING
Information Patent Application
ORIENTATION CHARACTERISTIC MEASUREMENT METHOD, ORIENTATION CHARACTE...
- Publication number 20220057197
- Publication date Feb 24, 2022
- HAMAMATSU PHOTONICS K. K.
- Kiyotada HOSOKAWA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD
- Publication number 20200348178
- Publication date Nov 5, 2020
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD
- Publication number 20200340862
- Publication date Oct 29, 2020
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20200096389
- Publication date Mar 26, 2020
- Hamamatsu Photonics K.K.
- Kenichiro IKEMURA
- G01 - MEASURING TESTING
Information Patent Application
ORIENTATION CHARACTERISTIC MEASUREMENT METHOD, ORIENTATION CHARACTE...
- Publication number 20200088514
- Publication date Mar 19, 2020
- Hamamatsu Photonics K.K.
- Kiyotada HOSOKAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20170212047
- Publication date Jul 27, 2017
- Hamamatsu Photonics K.K.
- Shigeru EURA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD
- Publication number 20150377770
- Publication date Dec 31, 2015
- Hamamatsu Photonics K.K.
- Shigeru EURA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASURING DEVICE, SPECTRUM MEASURING METHOD, AND SPECIMEN...
- Publication number 20150346096
- Publication date Dec 3, 2015
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING

Shigeru EURA

Person

Patents Grantslast 30 patents

Ultrasonic testing device and ultrasonic testing method

Orientation characteristic measurement method, orientation characte...

Light measurement device and light measurement method

Light measurement device and light measurement method

Orientation characteristic measurement method, orientation characte...

Spectrometry device and spectrometry method

Spectrum measuring device, spectrum measuring method, and specimen...

Optical measurement device and optical measurement method

Spectrum measuring device and spectrum measuring method

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...

ULTRASONIC TESTING DEVICE AND ULTRASONIC TESTING METHOD

ORIENTATION CHARACTERISTIC MEASUREMENT METHOD, ORIENTATION CHARACTE...

LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD

LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

ORIENTATION CHARACTERISTIC MEASUREMENT METHOD, ORIENTATION CHARACTE...

OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD

SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD

SPECTRUM MEASURING DEVICE, SPECTRUM MEASURING METHOD, AND SPECIMEN...