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Shigeru Honda
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Ritto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analyzer and image processing method
Patent number
11,733,188
Issue date
Aug 22, 2023
Jeol Ltd.
Kazunori Tsukamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analyzer
Patent number
11,609,191
Issue date
Mar 21, 2023
Jeol Ltd.
Kazunori Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analyzer
Patent number
11,467,106
Issue date
Oct 11, 2022
Jeol Ltd.
Kazunori Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
Scatter diagram display device and surface analyzer
Patent number
9,874,532
Issue date
Jan 23, 2018
Jeol Ltd.
Norihisa Mori
G01 - MEASURING TESTING
Information
Patent Grant
Phase analyzer, phase analysis method, and surface analyzer
Patent number
9,518,942
Issue date
Dec 13, 2016
Jeol Ltd.
Naoki Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for processing workpiece in tool machine and behavior measur...
Patent number
8,423,171
Issue date
Apr 16, 2013
Mitsubishi Heavy Industries, Ltd.
Yoshikatsu Sato
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
ANTERIOR SEGMENT ANALYSIS APPARATUS, ANTERIOR SEGMENT ANALYSIS METH...
Publication number
20240169547
Publication date
May 23, 2024
TOPCON CORPORATION
Shigeru HONDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Analyzing Method and Analyzer
Publication number
20240142395
Publication date
May 2, 2024
JEOL Ltd.
Koki Kato
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Analyzer and Image Processing Method
Publication number
20220244202
Publication date
Aug 4, 2022
JEOL Ltd.
Kazunori Tsukamoto
G01 - MEASURING TESTING
Information
Patent Application
VEHICLE TRAVEL ASSISTANCE APPARATUS
Publication number
20210316734
Publication date
Oct 14, 2021
SUBARU CORPORATION
Shigeru HONDA
B60 - VEHICLES IN GENERAL
Information
Patent Application
Analyzer
Publication number
20210025838
Publication date
Jan 28, 2021
JEOL Ltd.
Kazunori Tsukamoto
G01 - MEASURING TESTING
Information
Patent Application
X-Ray Analyzer
Publication number
20200378909
Publication date
Dec 3, 2020
JEOL Ltd.
Kazunori Tsukamoto
G01 - MEASURING TESTING
Information
Patent Application
Scatter Diagram Display Device and Surface Analyzer
Publication number
20160110896
Publication date
Apr 21, 2016
JEOL Ltd.
Norihisa Mori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Phase Analyzer, Phase Analysis Method, and Surface Analyzer
Publication number
20150362446
Publication date
Dec 17, 2015
JEOL Ltd.
Naoki Kato
G01 - MEASURING TESTING
Information
Patent Application
INTERFACE SYSTEM OF INDUSTRIAL MACHINE
Publication number
20150261204
Publication date
Sep 17, 2015
Mitsubishi Heavy Industries, Ltd.
Shigeru Honda
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD FOR PROCESSING WORKPIECE IN TOOL MACHINE AND BEHAVIOR MEASUR...
Publication number
20100145499
Publication date
Jun 10, 2010
Mitsubishi Heavy Industries, Ltd.
Yoshikatsu Sato
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR