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Shigeru Iwanaga
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Nara, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Ultrasonic flow rate measuring device
Patent number
7,913,575
Issue date
Mar 29, 2011
Panasonic Corporation
Shigeru Iwanaga
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic fluid measurement instrument having a plurality of split...
Patent number
7,360,449
Issue date
Apr 22, 2008
Matsushita Electric Industrial Co., Ltd.
Yasuhiro Umekage
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic type fluid measurement device
Patent number
7,237,441
Issue date
Jul 3, 2007
Matsushita Electric Industrial Co., Ltd.
Yasuhiro Umekage
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic flowmeter
Patent number
6,748,811
Issue date
Jun 15, 2004
Matsushita Electric Industrial Co., Ltd.
Shigeru Iwanaga
G01 - MEASURING TESTING
Information
Patent Grant
Gas leak detection system
Patent number
6,725,878
Issue date
Apr 27, 2004
Matsushita Electric Industrial Co., Ltd.
Motoyuki Nawa
G01 - MEASURING TESTING
Information
Patent Grant
Flow measuring device
Patent number
6,694,824
Issue date
Feb 24, 2004
Matsushita Electric Industrial Co., Ltd.
Norio Shinmura
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic flowmeter having reduced phase difference
Patent number
6,216,544
Issue date
Apr 17, 2001
Matsushita Electric Industrial Co., Ltd.
Akihisa Adachi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ULTRASONIC FLUID MEASURING DEVICE
Publication number
20100005902
Publication date
Jan 14, 2010
PANASONIC CORPORATION
Shigeru Iwanaga
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic fluid measurement instrument
Publication number
20070193367
Publication date
Aug 23, 2007
Yasuhiro Umekage
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic type fluid measurement device
Publication number
20060201259
Publication date
Sep 14, 2006
Yasuhiro Umekage
G01 - MEASURING TESTING
Information
Patent Application
Flow measuring device
Publication number
20020178836
Publication date
Dec 5, 2002
Norio Shinmura
G01 - MEASURING TESTING