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Shigeru Izawa

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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe storage container, prober apparatus, probe arranging method a...
    • Patent number 7,875,156
    • Issue date Jan 25, 2011
    • Hitachi High-Technologies Corporation
    • Masanori Gunji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 7,804,073
    • Issue date Sep 28, 2010
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Focused ion beam apparatus and liquid metal ion source
    • Patent number 7,435,972
    • Issue date Oct 14, 2008
    • Hitachi High-Technologies Corporation
    • Yuichi Madokoro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 7,420,181
    • Issue date Sep 2, 2008
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 7,211,805
    • Issue date May 1, 2007
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Focused ion beam apparatus and aperture
    • Patent number 7,189,982
    • Issue date Mar 13, 2007
    • Hitachi High-Technologies Corporation
    • Yuichi Madokoro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Liquid metal ion gun
    • Patent number 7,005,651
    • Issue date Feb 28, 2006
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    Probe Storage Container, Prober Apparatus, Probe Arranging Method a...
    • Publication number 20110093991
    • Publication date Apr 21, 2011
    • Hitachi High-Technologies Corporation
    • Masanori Gunji
    • G01 - MEASURING TESTING
  • Information Patent Application

    Liquid metal ion gun
    • Publication number 20080210883
    • Publication date Sep 4, 2008
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Probe Storage Container, Prober Apparatus, Probe Arranging Method a...
    • Publication number 20080204058
    • Publication date Aug 28, 2008
    • Hitachi High-Technologies Corporation
    • Masanori GUNJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Liquid metal ion gun
    • Publication number 20070257200
    • Publication date Nov 8, 2007
    • Hitachi High-Technologies Corporation
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Focused ion beam apparatus and aperture
    • Publication number 20070152174
    • Publication date Jul 5, 2007
    • Hitachi High-Technologies Corporation
    • Yuichi Madokoro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Liquid metal ion gun
    • Publication number 20060097186
    • Publication date May 11, 2006
    • Hitachi High-Technologies
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Focused ion beam apparatus and aperture
    • Publication number 20060054840
    • Publication date Mar 16, 2006
    • Hitachi High-Technologies Corporation
    • Yuichi Madokoro
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Liquid metal ion gun
    • Publication number 20050127304
    • Publication date Jun 16, 2005
    • Hiroyasu Kaga
    • H01 - BASIC ELECTRIC ELEMENTS