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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray sensor signal processor and X-ray computed tomography system...
Patent number
7,260,176
Issue date
Aug 21, 2007
Hitachi, Ltd.
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radioactive gas measurement apparatus and failed fuel detection system
Patent number
7,151,262
Issue date
Dec 19, 2006
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray sensor signal processor and X-ray computed tomography system...
Patent number
7,113,563
Issue date
Sep 26, 2006
Hitachi, Ltd.
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray sensor signal processor and X-ray computed tomography system...
Patent number
6,975,700
Issue date
Dec 13, 2005
Hitachi, Ltd.
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray sensor signal processor and X-ray computed tomography system...
Patent number
6,928,138
Issue date
Aug 9, 2005
Hitachi, Ltd.
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray sensor signal processor and X-ray computed tomography system...
Patent number
6,925,143
Issue date
Aug 2, 2005
Hitachi, Ltd.
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray sensor signal processor and x-ray computed tomography system...
Patent number
6,859,511
Issue date
Feb 22, 2005
Hitachi, Ltd.
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray sensor signal processor and X-ray computed tomography system...
Patent number
6,366,636
Issue date
Apr 2, 2002
Hitachi, Ltd.
Hiroshi Kamimura
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive inspection apparatus and inspection system using it
Patent number
6,333,962
Issue date
Dec 25, 2001
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Computerized tomography system
Patent number
6,327,328
Issue date
Dec 4, 2001
Hitachi, Ltd.
Katsutoshi Satoh
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive inspection apparatus and inspection system using it
Patent number
6,049,586
Issue date
Apr 11, 2000
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive inspection apparatus and inspection system using it
Patent number
5,933,473
Issue date
Aug 3, 1999
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Neutron individual dose meter neutron dose rate meter, neutron dete...
Patent number
RE35908
Issue date
Sep 29, 1998
Hitachi, Ltd.
Hiroshi Kitaguchi
250 - Radiant energy
Information
Patent Grant
Imaging method of X-ray computerized tomography and apparatus for X...
Patent number
5,640,462
Issue date
Jun 17, 1997
Hitachi, Ltd.
Katsutoshi Sato
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor radiation detection apparatus for discriminating radi...
Patent number
5,457,322
Issue date
Oct 10, 1995
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor detection apparatus for detecting nuclear radiation
Patent number
5,336,890
Issue date
Aug 9, 1994
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Neutron individual dose meter, neutron dose rate meter, neutron det...
Patent number
5,321,269
Issue date
Jun 14, 1994
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for analysis of particulate material, analytical method f...
Patent number
5,316,983
Issue date
May 31, 1994
Hitachi, Ltd.
Haruo Fujimori
G01 - MEASURING TESTING
Information
Patent Grant
CT system and method of using the same
Patent number
5,228,071
Issue date
Jul 13, 1993
Hitachi, Ltd.
Shoji Kamata
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis apparatus, especially computer tomography apparatus...
Patent number
5,222,114
Issue date
Jun 22, 1993
Hitachi, Ltd.
Shoji Kamata
G01 - MEASURING TESTING
Information
Patent Grant
Portable intensitometer and apparatus for centralized control of ex...
Patent number
5,099,127
Issue date
Mar 24, 1992
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
System for discriminating radiation-contaminated fragments and appa...
Patent number
5,076,502
Issue date
Dec 31, 1991
Hitachi, Ltd.
Hiroshi Kitaguchi
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Semiconductor radiation detector
Patent number
4,879,466
Issue date
Nov 7, 1989
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Control system
Patent number
4,843,537
Issue date
Jun 27, 1989
Hitachi, Ltd.
Setsuo Arita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for estimating sound source position
Patent number
4,641,526
Issue date
Feb 10, 1987
Hitachi, Ltd.
Shigeru Izumi
G01 - MEASURING TESTING
Information
Patent Grant
Chain-like self-moving robot and control system therefor
Patent number
4,621,532
Issue date
Nov 11, 1986
Hitachi, Ltd.
Atsushi Takagi
B08 - CLEANING
Information
Patent Grant
Unknown sound evaluating method and apparatus
Patent number
4,586,378
Issue date
May 6, 1986
Hitachi, Ltd.
Shigeru Izumi
G01 - MEASURING TESTING
Information
Patent Grant
Device for identifying rubbing locations in rotating machines
Patent number
4,377,947
Issue date
Mar 29, 1983
Hitachi, Ltd.
Osami Matsushita
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Grant
Method of locating sound generation within enclosure
Patent number
4,352,167
Issue date
Sep 28, 1982
The Chubu Electric Power Co., Inc.
Yuuji Hashimoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-ray sensor signal processor and X-ray computed tomography system...
Publication number
20070009082
Publication date
Jan 11, 2007
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIOACTIVE GAS MEASUREMENT APPARATUS AND FAILED FUEL DETECTION SYSTEM
Publication number
20060278828
Publication date
Dec 14, 2006
Hiroshi Kitaguchi
G01 - MEASURING TESTING
Information
Patent Application
X-ray sensor signal processor and x-ray computed tomography system...
Publication number
20060034420
Publication date
Feb 16, 2006
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-ray sensor signal processor and X-ray computed tomography system...
Publication number
20040264633
Publication date
Dec 30, 2004
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-ray sensor signal processor and X-ray computed tomography system...
Publication number
20040234024
Publication date
Nov 25, 2004
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-ray sensor signal processor and X-ray computed tomography system...
Publication number
20040223582
Publication date
Nov 11, 2004
Hiroshi Kamimura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-ray sensor signal processor and x-ray computed tomography system...
Publication number
20020154729
Publication date
Oct 24, 2002
Hiroshi Kamimura
G01 - MEASURING TESTING
Information
Patent Application
Radioactive gas measurement apparatus and failed fuel detection system
Publication number
20020084420
Publication date
Jul 4, 2002
Hitachi, Ltd.
Hiroshi Kitaguchi
G01 - MEASURING TESTING