Shigeru Kambayashi

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Detection system, detection method, and detection computer program...
- Patent number 7,239,278
- Issue date Jul 3, 2007
- Kabushiki Kaisha Toshiba
- Takashi Koiso
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor device with oxide mediated...
- Patent number 6,395,621
- Issue date May 28, 2002
- Kabushiki Kaisha Toshiba
- Ichiro Mizushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with oxide mediated epitaxial layer
- Patent number 6,346,732
- Issue date Feb 12, 2002
- Kabushiki Kaisha Toshiba
- Ichiro Mizushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 6,342,421
- Issue date Jan 29, 2002
- Kabushiki Kaisha Toshiba
- Yuichiro Mitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and its fabricating method
- Patent number 6,093,243
- Issue date Jul 25, 2000
- Kabushiki Kaisha Toshiba
- Takako Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and its fabricating method
- Patent number 6,066,872
- Issue date May 23, 2000
- Kabushiki Kaisha Toshiba
- Takako Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with element isolation film
- Patent number 6,018,185
- Issue date Jan 25, 2000
- Kabushiki Kaisha Toshiba
- Yuichiro Mitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a resist pattern
- Patent number 5,981,150
- Issue date Nov 9, 1999
- Kabushiki Kaisha Toshiba
- Masami Aoki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device and its fabricating method
- Patent number 5,879,447
- Issue date Mar 9, 1999
- Kabushiki Kaisha Toshiba
- Takako Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 5,864,161
- Issue date Jan 26, 1999
- Kabushiki Kaisha Toshiba
- Yuichiro Mitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and its fabricating method
- Patent number 5,582,640
- Issue date Dec 10, 1996
- Kabushiki Kaisha Toshiba
- Takako Okada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Detection system, detection method, and detection computer program...
- Publication number 20050046577
- Publication date Mar 3, 2005
- Takashi Koiso
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20020034864
- Publication date Mar 21, 2002
- Kabushiki Kaisha Toshiba
- Ichiro Mizushima
- H01 - BASIC ELECTRIC ELEMENTS

Shigeru Kambayashi

Person

Patents Grantslast 30 patents

Detection system, detection method, and detection computer program...

Method of manufacturing a semiconductor device with oxide mediated...

Semiconductor device with oxide mediated epitaxial layer

Semiconductor device and manufacturing method thereof

Semiconductor device and its fabricating method

Semiconductor device and its fabricating method

Semiconductor device with element isolation film

Method for forming a resist pattern

Semiconductor device and its fabricating method

Semiconductor device and manufacturing method thereof

Semiconductor device and its fabricating method

Patents Applicationslast 30 patents

Detection system, detection method, and detection computer program...

Semiconductor device and method of manufacturing the same