Shigeru Kawamata

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and cell evaluation method
- Patent number 12,215,308
- Issue date Feb 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Akira Ikeuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device and method for setting condition in ch...
- Patent number 11,404,242
- Issue date Aug 2, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuki Numata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging device
- Patent number 11,385,193
- Issue date Jul 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Chiba
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device and morphological feature data display method
- Patent number 11,321,585
- Issue date May 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Yaku Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging device
- Patent number 11,239,050
- Issue date Feb 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Miku Maehara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,763,078
- Issue date Sep 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus, observation method using charged p...
- Patent number 10,763,074
- Issue date Sep 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Chiba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,522,325
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus, observation method using charged p...
- Patent number 10,453,650
- Issue date Oct 22, 2019
- Hitachi High-Technologies Corporation
- Hiroyuki Chiba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and image display method for stereosco...
- Patent number 9,202,669
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Tatsuya Hirato
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,099,283
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and inclined observation image display...
- Patent number 9,012,842
- Issue date Apr 21, 2015
- Hitachi High-Technologies Corporation
- Wataru Kotake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 8,947,520
- Issue date Feb 3, 2015
- Hitachi High-Technologies Corporation
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method for correcting detected sig...
- Patent number 8,848,049
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Masato Kamio
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,143,573
- Issue date Mar 27, 2012
- Hitachi High-Technologies Corporation
- Sukehiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and three-dimensional shape measuring...
- Patent number 7,705,304
- Issue date Apr 27, 2010
- Hitachi High-Technologies Corporation
- Shigeru Kawamata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Imaging Device
- Publication number 20210247335
- Publication date Aug 12, 2021
- Hitachi High-Tech Corporation
- Hiroyuki CHIBA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Imaging Device
- Publication number 20210193432
- Publication date Jun 24, 2021
- Hitachi High-Tech Corporation
- Miku MAEHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Imaging Device and Morphological Feature Data Display Method
- Publication number 20200125894
- Publication date Apr 23, 2020
- Hitachi High-Technologies Corporation
- Yaku MAEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Device and Method for Setting Condition in Ch...
- Publication number 20200126754
- Publication date Apr 23, 2020
- Hitachi High-Technologies Corporation
- Yuki NUMATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20200066484
- Publication date Feb 27, 2020
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus and Cell Evaluation Method
- Publication number 20200056141
- Publication date Feb 20, 2020
- Hitachi High-Technologies Corporation
- Akira IKEUCHI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED P...
- Publication number 20200013583
- Publication date Jan 9, 2020
- Hitachi High-Technologies Corporation
- Hiroyuki CHIBA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED P...
- Publication number 20180323035
- Publication date Nov 8, 2018
- Hitachi High-Technologies Corporation
- Hiroyuki CHIBA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20180301316
- Publication date Oct 18, 2018
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND INCLINED OBSERVATION IMAGE DISPLAY...
- Publication number 20150001393
- Publication date Jan 1, 2015
- Wataru Kotake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE DISPLAY METHOD
- Publication number 20140001355
- Publication date Jan 2, 2014
- Hitachi High-Technologies Corporation
- Tatsuya Hirato
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING DETECTED SIG...
- Publication number 20130278745
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Masato Kamio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20120307038
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE DISPLAY METHOD
- Publication number 20120132803
- Publication date May 31, 2012
- Hitachi High-Technologies Corporation
- Tatsuya Hirato
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20120019648
- Publication date Jan 26, 2012
- Yoshinobu Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20090322973
- Publication date Dec 31, 2009
- Hitachi High-Technologies Corporation
- Sukehiro ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and Three-Dimensional Shape Measuring...
- Publication number 20080283747
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Shigeru Kawamata
- H01 - BASIC ELECTRIC ELEMENTS

Shigeru Kawamata

Person

Patents Grantslast 30 patents

Charged particle beam apparatus and cell evaluation method

Charged particle beam device and method for setting condition in ch...

Imaging device

Imaging device and morphological feature data display method

Imaging device

Charged particle beam device and image processing method in charged...

Charged particle beam apparatus, observation method using charged p...

Charged particle beam device and image processing method in charged...

Charged particle beam apparatus, observation method using charged p...

Charged particle beam device and image display method for stereosco...

Charged particle beam apparatus

Charged particle beam device and inclined observation image display...

Electron microscope

Charged particle beam device and method for correcting detected sig...

Charged particle beam apparatus

Scanning electron microscope and three-dimensional shape measuring...

Patents Applicationslast 30 patents

Imaging Device

Imaging Device

Imaging Device and Morphological Feature Data Display Method

Charged Particle Beam Device and Method for Setting Condition in Ch...

CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...

Charged Particle Beam Apparatus and Cell Evaluation Method

CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED P...

CHARGED PARTICLE BEAM APPARATUS, OBSERVATION METHOD USING CHARGED P...

CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...

CHARGED PARTICLE BEAM DEVICE AND INCLINED OBSERVATION IMAGE DISPLAY...

CHARGED PARTICLE BEAM DEVICE AND IMAGE DISPLAY METHOD

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING DETECTED SIG...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE AND IMAGE DISPLAY METHOD

ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM APPARATUS

Scanning Electron Microscope and Three-Dimensional Shape Measuring...