Shigeru Kikuda

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device capable of shortening test time and suppressin...
- Patent number 6,962,827
- Issue date Nov 8, 2005
- Renesas Technology Corp.
- Katsuya Furue
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with IO compression test mode
- Patent number 6,301,169
- Issue date Oct 9, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with improved noise resistivity
- Patent number 6,166,415
- Issue date Dec 26, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Sakemi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device with improved test efficiency
- Patent number 6,091,651
- Issue date Jul 18, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Kiyohiro Furutani
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having fast data writing mode and metho...
- Patent number 5,903,575
- Issue date May 11, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device permitting high speed data transfer and...
- Patent number 5,586,076
- Issue date Dec 17, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Miyamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy circuit for repairing defective bits in semiconductor me...
- Patent number 5,574,729
- Issue date Nov 12, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Mitsuya Kinoshita
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 5,519,243
- Issue date May 21, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device suitable for high integration
- Patent number 5,448,516
- Issue date Sep 5, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Yasuhiko Tsukikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device comprising a test circuit and a method...
- Patent number 5,384,784
- Issue date Jan 24, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Mori
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device including a plurality of ce...
- Patent number 5,357,478
- Issue date Oct 18, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having multiple memory arrays and inclu...
- Patent number 5,323,348
- Issue date Jun 21, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Mori
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having no through current flow in standby period
- Patent number 5,321,654
- Issue date Jun 14, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Miyamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor circuit device having multiplex selection functions
- Patent number 5,227,997
- Issue date Jul 13, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device including a redundancy circuitry for re...
- Patent number 5,146,429
- Issue date Sep 8, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Kawai
- G11 - INFORMATION STORAGE
Information Patent Grant
Delay circuit employing different threshold FET's
- Patent number 5,063,313
- Issue date Nov 5, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 4,994,689
- Issue date Feb 19, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- G05 - CONTROLLING REGULATING
Information Patent Grant
MIS transistor driven inverter circuit capable of individually cont...
- Patent number 4,931,668
- Issue date Jun 5, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delay circuit
- Patent number 4,914,326
- Issue date Apr 3, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dynamic random access memory having storage gate electrode groundin...
- Patent number 4,879,679
- Issue date Nov 7, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Kikuda
- G11 - INFORMATION STORAGE

Shigeru Kikuda

Person

Patents Grantslast 30 patents

Semiconductor device capable of shortening test time and suppressin...

Semiconductor memory device with IO compression test mode

Semiconductor device with improved noise resistivity

Semiconductor memory device with improved test efficiency

Semiconductor memory device having fast data writing mode and metho...

Semiconductor memory device permitting high speed data transfer and...

Redundancy circuit for repairing defective bits in semiconductor me...

Semiconductor device and manufacturing method thereof

Semiconductor memory device suitable for high integration

Semiconductor memory device comprising a test circuit and a method...

Semiconductor integrated circuit device including a plurality of ce...

Semiconductor memory device having multiple memory arrays and inclu...

Semiconductor device having no through current flow in standby period

Semiconductor circuit device having multiplex selection functions

Semiconductor memory device including a redundancy circuitry for re...

Delay circuit employing different threshold FET's

Semiconductor integrated circuit device

MIS transistor driven inverter circuit capable of individually cont...

Delay circuit

Dynamic random access memory having storage gate electrode groundin...