Shigeru Koumoto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Periodicity analysis apparatus, method and program recording medium
- Patent number 12,019,433
- Issue date Jun 25, 2024
- NEC Corporation
- Murtuza Petladwala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Event monitoring apparatus, method and program recording medium
- Patent number 11,755,448
- Issue date Sep 12, 2023
- NEC Corporation
- Murtuza Petladwala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model structure selection apparatus, method, disaggregation system...
- Patent number 11,635,454
- Issue date Apr 25, 2023
- NEC Corporation
- Murtuza Petladwala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Feature transformation apparatus and method, and recording medium
- Patent number 11,586,703
- Issue date Feb 21, 2023
- NEC Corporation
- Ryota Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Production management apparatus, method, and non-transitory medium
- Patent number 11,501,388
- Issue date Nov 15, 2022
- NEC Corporation
- Eisuke Saneyoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
State estimation apparatus, method, and program
- Patent number 11,486,915
- Issue date Nov 1, 2022
- NEC Corporation
- Eisuke Saneyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Anomaly determination apparatus, anomaly determination method, and...
- Patent number 11,409,591
- Issue date Aug 9, 2022
- NEC Corporation
- Ryota Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement apparatus and method
- Patent number 11,360,129
- Issue date Jun 14, 2022
- NEC Corporation
- Shingo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Facility state monitoring system, analysis apparatus, method, and p...
- Patent number 11,346,867
- Issue date May 31, 2022
- NEC Corporation
- Shigeru Koumoto
- G08 - SIGNALLING
Information Patent Grant
Maintenance monitoring apparatus, system, method, and program
- Patent number 11,263,859
- Issue date Mar 1, 2022
- NEC Corporation
- Yuko Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
State change detection apparatus, method, and non-transitory medium
- Patent number 11,237,584
- Issue date Feb 1, 2022
- NEC Corporation
- Takahiro Toizumi
- G01 - MEASURING TESTING
Information Patent Grant
Anomaly detection apparatus, method, and program recording medium
- Patent number 11,200,134
- Issue date Dec 14, 2021
- NEC Corporation
- Murtuza Petladwala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermoelectric conversion element, thermoelectric conversion system...
- Patent number 10,840,427
- Issue date Nov 17, 2020
- NEC Corporation
- Masahiko Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information providing apparatus, information providing method, and...
- Patent number 10,750,251
- Issue date Aug 18, 2020
- NEC Corporation
- Takahiro Toizumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing device, data processing method, and non-transitory...
- Patent number 10,712,374
- Issue date Jul 14, 2020
- NEC Corporation
- Takahiro Toizumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing device, data processing method, and non-transitory...
- Patent number 10,712,375
- Issue date Jul 14, 2020
- NEC Corporation
- Takahiro Toizumi
- G01 - MEASURING TESTING
Information Patent Grant
Thermoelectric conversion element and method of manufacturing the s...
- Patent number 10,396,267
- Issue date Aug 27, 2019
- NEC Corporation
- Akihiro Kirihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermoelectric conversion element and method for making the same
- Patent number 10,326,069
- Issue date Jun 18, 2019
- NEC Corporation
- Masahiko Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermoelectric conversion element and method of manufacturing the s...
- Patent number 9,947,855
- Issue date Apr 17, 2018
- NEC Corporation
- Akihiro Kirihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermoelectric conversion element and manufacturing method for same
- Patent number 9,859,486
- Issue date Jan 2, 2018
- NEC Corporation
- Akihiro Kirihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermoelectric conversion element and manufacturing method for the...
- Patent number 9,608,095
- Issue date Mar 28, 2017
- NEC Corporation
- Masahiko Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermoelectric conversion element and method for manufacturing the...
- Patent number 9,306,153
- Issue date Apr 5, 2016
- NEC Corporation
- Masahiko Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermoelectric conversion element
- Patent number 9,059,336
- Issue date Jun 16, 2015
- NEC Corporation
- Akihiro Kirihara
- G01 - MEASURING TESTING
Information Patent Grant
Electrode structure, semiconductor element, and methods of manufact...
- Patent number 8,304,335
- Issue date Nov 6, 2012
- Renesas Electronics Corporation
- Shigeru Koumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrode structure, semiconductor element, and methods of manufact...
- Patent number 8,169,078
- Issue date May 1, 2012
- Renesas Electronics Corporation
- Shigeru Koumoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PERIODICITY ANALYSIS APPARATUS, METHOD AND PROGRAM RECORDING MEDIUM
- Publication number 20210373543
- Publication date Dec 2, 2021
- NEC Corporation
- Murtuza PETLADWALA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVENT MONITORING APPARATUS, METHOD AND PROGRAM RECORDING MEDIUM
- Publication number 20210374031
- Publication date Dec 2, 2021
- NEC Corporation
- Murtuza PETLADWALA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURMENT APPARATUS AND METHOD
- Publication number 20210293861
- Publication date Sep 23, 2021
- NEC Corporation
- Shingo TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
MAINTENANCE PLAN FORMULATION DEVICE, METHOD, AND NON-TRANSITORY MEDIUM
- Publication number 20210278832
- Publication date Sep 9, 2021
- NEC Corporation
- Shigeru KOUMOTO
- G05 - CONTROLLING REGULATING
Information Patent Application
ANOMALY DETECTION APPARATUS, METHOD, AND PROGRAM RECORDING MEDIUM
- Publication number 20210109833
- Publication date Apr 15, 2021
- NEC Corporation
- Murtuza PETLADWALA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODEL STRUCTURE SELECTION APPARATUS, METHOD, DISAGGREGATION SYSTEM...
- Publication number 20210097417
- Publication date Apr 1, 2021
- NEC Corporation
- Murtuza PETLADWALA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAINTENANCE MONITORING APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20210090376
- Publication date Mar 25, 2021
- NEC Corporation
- Yuko OHTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA STORAGE APPARATUS, METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20210026534
- Publication date Jan 28, 2021
- NEC Corporation
- Shigeru KOUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANOMALY DETERMINATION APPARATUS, ANOMALY DETERMINATION METHOD, AND...
- Publication number 20200387418
- Publication date Dec 10, 2020
- NEC Corporation
- Ryota SUZUKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FACILITY STATE MONITORING SYSTEM, ANALYSIS APPARATUS, METHOD, AND P...
- Publication number 20200379020
- Publication date Dec 3, 2020
- NEC Corporation
- Shigeru KOUMOTO
- G01 - MEASURING TESTING
Information Patent Application
STATE ESTIMATION APPARATUS, METHOD, AND PROGRAM
- Publication number 20200166552
- Publication date May 28, 2020
- NEC Corporation
- Eisuke SANEYOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRODUCTION MANAGEMENT APPARATUS, METHOD, AND NON-TRANSITORY MEDIUM
- Publication number 20200058081
- Publication date Feb 20, 2020
- NEC Corporation
- Eisuke SANEYOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STATE ESTIMATION APPARATUS, STATE ESTIMATION METHOD, AND NON-TRANSI...
- Publication number 20190324070
- Publication date Oct 24, 2019
- NEC Corporation
- Eisuke SANEYOSHI
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM DISAGGREGATION APPARATUS, METHOD AND NON-TRANSITORY MEDIUM
- Publication number 20190277894
- Publication date Sep 12, 2019
- NEC Corporation
- Ryota SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
STATE CHANGE DETECTION APPARATUS, METHOD, AND NON-TRANSITORY MEDIUM
- Publication number 20190187736
- Publication date Jun 20, 2019
- NEC Corporation
- Takahiro TOIZUMI
- G05 - CONTROLLING REGULATING
Information Patent Application
INFORMATION PROVIDING APPARATUS, INFORMATION PROVIDING METHOD, AND...
- Publication number 20180255372
- Publication date Sep 6, 2018
- NEC Corporation
- Takahiro TOIZUMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION OUTPUT APPARATUS, AND INFORMATION OUTPUT METHOD
- Publication number 20180254661
- Publication date Sep 6, 2018
- NEC Corporation
- Takahiro TOIZUMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Thermoelectric Conversion Element and Method of Manufacturing the S...
- Publication number 20180190894
- Publication date Jul 5, 2018
- NEC Corporation
- Akihiro Kirihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND NON-TRANSITORY...
- Publication number 20180120363
- Publication date May 3, 2018
- NEC Corporation
- Takahiro TOIZUMI
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND NON-TRANSITORY...
- Publication number 20180088158
- Publication date Mar 29, 2018
- NEC Corporation
- Takahiro TOIZUMI
- G01 - MEASURING TESTING
Information Patent Application
Thermoelectric Conversion Element and Method for Making the Same
- Publication number 20150372213
- Publication date Dec 24, 2015
- NEC Corporation
- Masahiko Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC CONVERSION ELEMENT AND MANUFACTURING METHOD FOR THE...
- Publication number 20150333247
- Publication date Nov 19, 2015
- NEC Corporation
- Masahiko Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC CONVERSION ELEMENT, USE OF THE SAME, AND METHOD OF M...
- Publication number 20150303363
- Publication date Oct 22, 2015
- NEC Corporation
- Akihiro KIRIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC CONVERSION ELEMENT AND METHOD FOR MANUFACTURING THE...
- Publication number 20150236246
- Publication date Aug 20, 2015
- NEC Corporation
- Masahiko Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC CONVERSION ELEMENT AND MANUFACTURING METHOD FOR SAME
- Publication number 20150194587
- Publication date Jul 9, 2015
- Akihiro Kirihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC CONVERSION ELEMENT, THERMOELECTRIC CONVERSION SYSTEM...
- Publication number 20150101648
- Publication date Apr 16, 2015
- NEC Corporation
- Masahiko Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC CONVERSION ELEMENT AND METHOD OF MANUFACTURING THE S...
- Publication number 20140230873
- Publication date Aug 21, 2014
- NEC Corporation
- Akihiro Kirihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOELECTRIC CONVERSION ELEMENT
- Publication number 20140224293
- Publication date Aug 14, 2014
- NEC Corporation
- Akihiro Kirihara
- G01 - MEASURING TESTING
Information Patent Application
THERMOELECTRIC CONVERSION ELEMENT AND METHOD OF MANUFACTURING THE SAME
- Publication number 20140224294
- Publication date Aug 14, 2014
- NEC Corporation
- Shigeru Koumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRODE STUCTURE, SEMICONDUCTOR ELEMENT, AND METHODS OF MANUFACTU...
- Publication number 20120028456
- Publication date Feb 2, 2012
- RENESAS ELECTRONICS CORPORATION
- Shigeru KOUMOTO
- H01 - BASIC ELECTRIC ELEMENTS

Shigeru Koumoto

Person

Patents Grantslast 30 patents

Periodicity analysis apparatus, method and program recording medium

Event monitoring apparatus, method and program recording medium

Model structure selection apparatus, method, disaggregation system...

Feature transformation apparatus and method, and recording medium

Production management apparatus, method, and non-transitory medium

State estimation apparatus, method, and program

Anomaly determination apparatus, anomaly determination method, and...

Measurement apparatus and method

Facility state monitoring system, analysis apparatus, method, and p...

Maintenance monitoring apparatus, system, method, and program

State change detection apparatus, method, and non-transitory medium

Anomaly detection apparatus, method, and program recording medium

Thermoelectric conversion element, thermoelectric conversion system...

Information providing apparatus, information providing method, and...

Data processing device, data processing method, and non-transitory...

Data processing device, data processing method, and non-transitory...

Thermoelectric conversion element and method of manufacturing the s...

Thermoelectric conversion element and method for making the same

Thermoelectric conversion element and method of manufacturing the s...

Thermoelectric conversion element and manufacturing method for same

Thermoelectric conversion element and manufacturing method for the...

Thermoelectric conversion element and method for manufacturing the...

Thermoelectric conversion element

Electrode structure, semiconductor element, and methods of manufact...

Electrode structure, semiconductor element, and methods of manufact...

Patents Applicationslast 30 patents

PERIODICITY ANALYSIS APPARATUS, METHOD AND PROGRAM RECORDING MEDIUM

EVENT MONITORING APPARATUS, METHOD AND PROGRAM RECORDING MEDIUM

MEASURMENT APPARATUS AND METHOD

MAINTENANCE PLAN FORMULATION DEVICE, METHOD, AND NON-TRANSITORY MEDIUM

ANOMALY DETECTION APPARATUS, METHOD, AND PROGRAM RECORDING MEDIUM

MODEL STRUCTURE SELECTION APPARATUS, METHOD, DISAGGREGATION SYSTEM...

MAINTENANCE MONITORING APPARATUS, SYSTEM, METHOD, AND PROGRAM

DATA STORAGE APPARATUS, METHOD, PROGRAM, AND RECORDING MEDIUM

ANOMALY DETERMINATION APPARATUS, ANOMALY DETERMINATION METHOD, AND...

FACILITY STATE MONITORING SYSTEM, ANALYSIS APPARATUS, METHOD, AND P...

STATE ESTIMATION APPARATUS, METHOD, AND PROGRAM

PRODUCTION MANAGEMENT APPARATUS, METHOD, AND NON-TRANSITORY MEDIUM

STATE ESTIMATION APPARATUS, STATE ESTIMATION METHOD, AND NON-TRANSI...

WAVEFORM DISAGGREGATION APPARATUS, METHOD AND NON-TRANSITORY MEDIUM

STATE CHANGE DETECTION APPARATUS, METHOD, AND NON-TRANSITORY MEDIUM

INFORMATION PROVIDING APPARATUS, INFORMATION PROVIDING METHOD, AND...

INFORMATION OUTPUT APPARATUS, AND INFORMATION OUTPUT METHOD

Thermoelectric Conversion Element and Method of Manufacturing the S...

DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND NON-TRANSITORY...

DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND NON-TRANSITORY...

Thermoelectric Conversion Element and Method for Making the Same

THERMOELECTRIC CONVERSION ELEMENT AND MANUFACTURING METHOD FOR THE...

THERMOELECTRIC CONVERSION ELEMENT, USE OF THE SAME, AND METHOD OF M...

THERMOELECTRIC CONVERSION ELEMENT AND METHOD FOR MANUFACTURING THE...

THERMOELECTRIC CONVERSION ELEMENT AND MANUFACTURING METHOD FOR SAME

THERMOELECTRIC CONVERSION ELEMENT, THERMOELECTRIC CONVERSION SYSTEM...

THERMOELECTRIC CONVERSION ELEMENT AND METHOD OF MANUFACTURING THE S...

THERMOELECTRIC CONVERSION ELEMENT

THERMOELECTRIC CONVERSION ELEMENT AND METHOD OF MANUFACTURING THE SAME

ELECTRODE STUCTURE, SEMICONDUCTOR ELEMENT, AND METHODS OF MANUFACTU...