Shigeru Matsumura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test-use individual substrate, probe, and semiconductor wafer testi...
- Patent number 8,922,232
- Issue date Dec 30, 2014
- Advantest Corporation
- Shigeru Matsumura
- G01 - MEASURING TESTING
Information Patent Grant
Fixing apparatus for a probe card
- Patent number 8,212,579
- Issue date Jul 3, 2012
- Advantest Corporation
- Yoshihiro Abe
- G01 - MEASURING TESTING
Information Patent Grant
Connection board, probe card, and electronic device test apparatus...
- Patent number 8,134,381
- Issue date Mar 13, 2012
- Advantest Corporation
- Yoshihiro Abe
- G01 - MEASURING TESTING
Information Patent Grant
Connector assembly, receptacle type connector, and interface apparatus
- Patent number 7,690,944
- Issue date Apr 6, 2010
- Advantest Corporation
- Shigeru Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface apparatus for electronic device test apparatus
- Patent number 7,611,377
- Issue date Nov 3, 2009
- Advantest Corporation
- Shigeru Matsumura
- G01 - MEASURING TESTING
Information Patent Grant
System for mating and demating multiple connectors mounted on board...
- Patent number 7,484,285
- Issue date Feb 3, 2009
- Advantest Corp.
- Masanori Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact terminal for measurement, measurement apparatus, probe card...
- Patent number 7,474,109
- Issue date Jan 6, 2009
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Grant
Foam coaxial cable and method of manufacturing the same
- Patent number 7,355,123
- Issue date Apr 8, 2008
- Hirakawa Hewtech Corporation
- Hiroyuki Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
infrared gas analyzer and infrared gas analysis method
- Patent number 7,323,687
- Issue date Jan 29, 2008
- Yokogawa Electric Corporation
- Tomoaki Nanko
- G01 - MEASURING TESTING
Information Patent Grant
Connector
- Patent number 7,144,260
- Issue date Dec 5, 2006
- Advantest Corporation
- Shigeru Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector
- Patent number 7,125,264
- Issue date Oct 24, 2006
- Advantest Corporation
- Shigeru Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bump and method of forming bump
- Patent number 7,084,657
- Issue date Aug 1, 2006
- Advantest Corporation
- Shigeru Matsumura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Connector, electronic component fixing device, and tester
- Patent number 7,033,196
- Issue date Apr 25, 2006
- Advantest Corp.
- Shigeru Murayama
- G01 - MEASURING TESTING
Information Patent Grant
High accuracy foamed coaxial cable and method for manufacturing the...
- Patent number 6,963,032
- Issue date Nov 8, 2005
- Hirakawa Hewtech Corporation
- Tetsuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector
- Patent number 6,846,189
- Issue date Jan 25, 2005
- Advantest Corporation
- Shigeru Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Boundary line detecting method and apparatus, image processing meth...
- Patent number 6,724,938
- Issue date Apr 20, 2004
- GE Medical Systems Global Technology Company, LLC
- Shigeru Matsumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pin connector, pin connector holder and packaging board for mountin...
- Patent number RE37961
- Issue date Jan 7, 2003
- Advantest Corporation
- Shigeru Matsumura
- 439 - Electrical connectors
Information Patent Grant
Socket and connector therefor for connecting with an electrical com...
- Patent number 6,416,342
- Issue date Jul 9, 2002
- Advantest Corporation
- Shigeru Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device testing apparatus and its calibration method
- Patent number 6,417,682
- Issue date Jul 9, 2002
- Advantest Corporation
- Toshikazu Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Socket and connector
- Patent number 6,213,804
- Issue date Apr 10, 2001
- Advantest Corporation
- Shigeru Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contactor for semiconductor IC testers
- Patent number D432504
- Issue date Oct 24, 2000
- Advantest Corporation
- Shigeru Matsumura
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Contactor for semiconductor IC testers
- Patent number D426522
- Issue date Jun 13, 2000
- Advantest Corporation
- Shigeru Matsumura
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Socket for measuring a ball grid array semiconductor
- Patent number 6,069,481
- Issue date May 30, 2000
- Advantest Corporation
- Shigeru Matsumura
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for semiconductor IC testers
- Patent number D421968
- Issue date Mar 28, 2000
- Advantest Corporation
- Shigeru Matsumura
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
IC socket structure
- Patent number 6,012,929
- Issue date Jan 11, 2000
- Advantest Corp.
- Shigeru Matsumura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pin connector, pin connector holder and packaging board for mountin...
- Patent number 5,911,606
- Issue date Jun 15, 1999
- Advantest Corporation
- Shigeru Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC socket and guide member
- Patent number 5,813,869
- Issue date Sep 29, 1998
- Advantest Corporation
- Shigeru Matsumura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pin socket connector for print circuit board
- Patent number 5,733,133
- Issue date Mar 31, 1998
- Advantest Corp.
- Shigeru Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image reconstruction process and apparatus using interpolated image...
- Patent number 5,148,499
- Issue date Sep 15, 1992
- Yokogawa Medical Systems, Limited
- Shigeru Matsumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Convolution processing method for X-ray tomographic apparatus
- Patent number 5,140,520
- Issue date Aug 18, 1992
- Yokogawa Medical Systems, Limited
- Shigeru Matsumura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER TRAY, SEMICONDUCTOR WAFER TEST APPARATUS, AND TEST METHOD OF...
- Publication number 20130082727
- Publication date Apr 4, 2013
- Advantest Corporation
- Shigeru Matsumura
- G01 - MEASURING TESTING
Information Patent Application
TEST-USE INDIVIDUAL SUBSTRATE, PROBE, AND SEMICONDUCTOR WAFER TESTI...
- Publication number 20120049876
- Publication date Mar 1, 2012
- Shinko Electric Industries Co., Ltd.
- Shigeru MATSUMURA
- G01 - MEASURING TESTING
Information Patent Application
FIXING APPARATUS FOR A PROBE CARD
- Publication number 20100127726
- Publication date May 27, 2010
- Advantest Corporation
- Yoshihiro Abe
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION BOARD, PROBE CARD, AND ELECTRONIC DEVICE TEST APPARATUS...
- Publication number 20100102837
- Publication date Apr 29, 2010
- Advantest Corporation
- Yoshihiro Abe
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION BOARD FOR ELECTRONIC DEVICE TEST APPARATUS
- Publication number 20090128172
- Publication date May 21, 2009
- Advantest Corporation
- Shintaro Takaki
- G01 - MEASURING TESTING
Information Patent Application
Infrared Gas Analyzer
- Publication number 20080093556
- Publication date Apr 24, 2008
- YOKOGAWA ELECTRIC CORPORATION
- Hideaki Yamagishi
- G01 - MEASURING TESTING
Information Patent Application
Connector assembly, receptacle type connector, and interface apparatus
- Publication number 20080076298
- Publication date Mar 27, 2008
- Shigeru Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interface apparatus for electronic device test apparatus
- Publication number 20080076297
- Publication date Mar 27, 2008
- Advantest Corporation
- Shigeru Matsumura
- G01 - MEASURING TESTING
Information Patent Application
Infrared gas analyzer
- Publication number 20070046925
- Publication date Mar 1, 2007
- YOKOGAWA ELECTRIC CORPORATION
- Hideaki Yamagishi
- G01 - MEASURING TESTING
Information Patent Application
Connector
- Publication number 20070004254
- Publication date Jan 4, 2007
- Advantest Corporation
- Shigeru Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contact terminal for measurement, measurement apparatus, probe card...
- Publication number 20060279304
- Publication date Dec 14, 2006
- Advantest Corporation
- Tetsuya Kuitani
- G01 - MEASURING TESTING
Information Patent Application
Foam coaxial cable and method of manufacturing the same
- Publication number 20060254792
- Publication date Nov 16, 2006
- Hiroyuki Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Infrared gas analyzer and infrared gas analysis method
- Publication number 20060118724
- Publication date Jun 8, 2006
- Tomoaki Nanko
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR
- Publication number 20060057874
- Publication date Mar 16, 2006
- Advantest Corporation
- Shigeru Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Connector, electronic component fixing device, and tester
- Publication number 20050159034
- Publication date Jul 21, 2005
- Shigeru Murayama
- G01 - MEASURING TESTING
Information Patent Application
Device interface apparatus
- Publication number 20050159050
- Publication date Jul 21, 2005
- Hiroyuki Hama
- G01 - MEASURING TESTING
Information Patent Application
High accuracy foamed coaxial cable and method for manufacturing the...
- Publication number 20050115738
- Publication date Jun 2, 2005
- Tetsuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Connector connecting /disconnecting tool
- Publication number 20050081372
- Publication date Apr 21, 2005
- Masanori Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Connector
- Publication number 20050054224
- Publication date Mar 10, 2005
- Advantest Corporation
- Shigeru Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTOR
- Publication number 20040242035
- Publication date Dec 2, 2004
- Shigeru Murayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bump and method of forming bump
- Publication number 20030101584
- Publication date Jun 5, 2003
- Shigeru Matsumura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Signal processing method and apparatus and imaging system
- Publication number 20020009204
- Publication date Jan 24, 2002
- Shigeru Matsumura
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE AND DEVICE SOCKET
- Publication number 20010046127
- Publication date Nov 29, 2001
- SHIGERU MATSUMURA
- G01 - MEASURING TESTING
Information Patent Application
Socket and connector therefor for connecting with an electrical com...
- Publication number 20010010980
- Publication date Aug 2, 2001
- Advantest Corporation
- Shigeru Matsumura
- H01 - BASIC ELECTRIC ELEMENTS

Shigeru Matsumura

Person

Patents Grantslast 30 patents

Test-use individual substrate, probe, and semiconductor wafer testi...

Fixing apparatus for a probe card

Connection board, probe card, and electronic device test apparatus...

Connector assembly, receptacle type connector, and interface apparatus

Interface apparatus for electronic device test apparatus

System for mating and demating multiple connectors mounted on board...

Contact terminal for measurement, measurement apparatus, probe card...

Foam coaxial cable and method of manufacturing the same

infrared gas analyzer and infrared gas analysis method

Connector

Connector

Bump and method of forming bump

Connector, electronic component fixing device, and tester

High accuracy foamed coaxial cable and method for manufacturing the...

Connector

Boundary line detecting method and apparatus, image processing meth...

Pin connector, pin connector holder and packaging board for mountin...

Socket and connector therefor for connecting with an electrical com...

Semiconductor device testing apparatus and its calibration method

Socket and connector

Contactor for semiconductor IC testers

Contactor for semiconductor IC testers

Socket for measuring a ball grid array semiconductor

Contactor for semiconductor IC testers

IC socket structure

Pin connector, pin connector holder and packaging board for mountin...

IC socket and guide member

Pin socket connector for print circuit board

Image reconstruction process and apparatus using interpolated image...

Convolution processing method for X-ray tomographic apparatus

Patents Applicationslast 30 patents

WAFER TRAY, SEMICONDUCTOR WAFER TEST APPARATUS, AND TEST METHOD OF...

TEST-USE INDIVIDUAL SUBSTRATE, PROBE, AND SEMICONDUCTOR WAFER TESTI...

FIXING APPARATUS FOR A PROBE CARD

CONNECTION BOARD, PROBE CARD, AND ELECTRONIC DEVICE TEST APPARATUS...

CALIBRATION BOARD FOR ELECTRONIC DEVICE TEST APPARATUS

Infrared Gas Analyzer

Connector assembly, receptacle type connector, and interface apparatus

Interface apparatus for electronic device test apparatus

Infrared gas analyzer

Connector

Contact terminal for measurement, measurement apparatus, probe card...

Foam coaxial cable and method of manufacturing the same

Infrared gas analyzer and infrared gas analysis method

CONNECTOR

Connector, electronic component fixing device, and tester

Device interface apparatus

High accuracy foamed coaxial cable and method for manufacturing the...

Connector connecting /disconnecting tool

Connector

CONNECTOR

Bump and method of forming bump

Signal processing method and apparatus and imaging system

SEMICONDUCTOR PACKAGE AND DEVICE SOCKET

Socket and connector therefor for connecting with an electrical com...