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Shigeru Miwa
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Niihari-Gun, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Probe manufacturing method, probe, and scanning probe microscope
Patent number
7,388,199
Issue date
Jun 17, 2008
Hitachi Kenki Fine Tech Co., Ltd.
Takafumi Morimoto
G01 - MEASURING TESTING
Information
Patent Grant
Scanning type probe microscope and probe moving control method ther...
Patent number
7,350,404
Issue date
Apr 1, 2008
Hitachi Kenki Fine Tech Co., Ltd.
Tooru Kurenuma
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and measurement method using the same
Patent number
7,333,191
Issue date
Feb 19, 2008
Hitachi Kenki FineTech. Co., Ltd.
Ken Murayama
G01 - MEASURING TESTING
Information
Patent Grant
Portable ultrasonic detector
Patent number
6,397,681
Issue date
Jun 4, 2002
Hitachi Construction Machinery Co., Ltd.
Hajime Mizunoya
G01 - MEASURING TESTING
Information
Patent Grant
Portable non-destructive inspection device and support casing therefor
Patent number
6,112,593
Issue date
Sep 5, 2000
Hitachi Construction Machinery Co., Ltd.
Shigenori Aoki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Probe replacement method for scanning probe microscope
Publication number
20070180889
Publication date
Aug 9, 2007
Ken Murayama
G01 - MEASURING TESTING
Information
Patent Application
Scanning type probe microscope and probe moving control method ther...
Publication number
20060284083
Publication date
Dec 21, 2006
Tooru Kurenuma
G01 - MEASURING TESTING
Information
Patent Application
Probe manufacturing method, probe, and scanning probe microsope
Publication number
20060284084
Publication date
Dec 21, 2006
Takafumi Morimoto
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope and measurement method using the same
Publication number
20050012936
Publication date
Jan 20, 2005
Ken Murayama
G01 - MEASURING TESTING