Shigeru Nakayama

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Microscope system
- Patent number 9,261,690
- Issue date Feb 16, 2016
- Nikon Corporation
- Naoki Fukutake
- G02 - OPTICS
Information Patent Grant
Optical coherence tomography observation apparatus, method for dete...
- Patent number 8,953,172
- Issue date Feb 10, 2015
- Nikon Corporation
- Takeshi Kawano
- G01 - MEASURING TESTING
Information Patent Grant
Basic-administrative-tasks software program and a method of selling...
- Patent number 6,952,819
- Issue date Oct 4, 2005
- Obic Business Consultant Co., Ltd.
- Shigefumi Wada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interferometer that measures aspherical surfaces
- Patent number 6,456,382
- Issue date Sep 24, 2002
- Nikon Corporation
- Hiroshi Ichihara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric apparatus and methods for measuring surface topogra...
- Patent number 6,344,898
- Issue date Feb 5, 2002
- Nikon Corporation
- Takashi Gemma
- G01 - MEASURING TESTING
Information Patent Grant
Exposure apparatus and positioning method
- Patent number 6,097,473
- Issue date Aug 1, 2000
- Nikon Corporation
- Kazuya Ota
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Shape measurement method and high-precision lens manufacturing process
- Patent number 5,986,760
- Issue date Nov 16, 1999
- Nikon Corporation
- Shigeru Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for position sensing
- Patent number 5,796,483
- Issue date Aug 18, 1998
- Nikon Corporation
- Shigeru Nakayama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sheet and original feeding for image forming system
- Patent number 4,433,905
- Issue date Feb 28, 1984
- Tokyo Shibaura Denki Kabushiki Kaisha
- Toshio Haramaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrophotographic sensitizing screen
- Patent number 4,272,597
- Issue date Jun 9, 1981
- Masaji Nishikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL COHERENCE TOMOGRAPHY OBSERVATION APPARATUS, METHOD FOR DETE...
- Publication number 20140016136
- Publication date Jan 16, 2014
- Nikon Corporation
- Takeshi KAWANO
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE SYSTEM
- Publication number 20120293644
- Publication date Nov 22, 2012
- NIKON CORPORATION
- Naoki FUKUTAKE
- G02 - OPTICS
Information Patent Application
Basic work processing system
- Publication number 20070067717
- Publication date Mar 22, 2007
- Shigefumi Wada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Input/output screen creating system, input/output screen creating m...
- Publication number 20060031747
- Publication date Feb 9, 2006
- OBIC BUSINESS CONSULTANTS CO., LTD.
- Shigefumi Wada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and devices for measuring a surface profile of an optical e...
- Publication number 20040036890
- Publication date Feb 26, 2004
- NIKON CORPORATION
- Shigeru Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for measuring surface shape, lateral coordinate calibrati...
- Publication number 20020080366
- Publication date Jun 27, 2002
- Nikon Corporation
- Shigeru Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for measuring surface profiles and wavefront...
- Publication number 20020012124
- Publication date Jan 31, 2002
- NIKON CORPORATION
- Shigeru Nakayama
- G01 - MEASURING TESTING

Shigeru Nakayama

Person

Patents Grantslast 30 patents

Microscope system

Optical coherence tomography observation apparatus, method for dete...

Basic-administrative-tasks software program and a method of selling...

Interferometer that measures aspherical surfaces

Interferometric apparatus and methods for measuring surface topogra...

Exposure apparatus and positioning method

Shape measurement method and high-precision lens manufacturing process

Method and apparatus for position sensing

Sheet and original feeding for image forming system

Electrophotographic sensitizing screen

Patents Applicationslast 30 patents

OPTICAL COHERENCE TOMOGRAPHY OBSERVATION APPARATUS, METHOD FOR DETE...

MICROSCOPE SYSTEM

Basic work processing system

Input/output screen creating system, input/output screen creating m...

Methods and devices for measuring a surface profile of an optical e...

Apparatus for measuring surface shape, lateral coordinate calibrati...

Apparatus and methods for measuring surface profiles and wavefront...