Shigeru ONO

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Patents Grantslast 30 patents

Information Patent Grant
Electromagnetic wave measurement device, measurement method, and re...
- Patent number 9,157,857
- Issue date Oct 13, 2015
- Advantest Corporation
- Shigeru Ono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RE...
- Publication number 20140166883
- Publication date Jun 19, 2014
- Shigeru ONO
- G01 - MEASURING TESTING