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Shigeru Sugamori
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Gyoda, JP
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last 30 patents
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Patent Grant
IC Tester
Patent number
4,497,056
Issue date
Jan 29, 1985
Takeda Riken Co. Ltd.
Shigeru Sugamori
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor memory device test apparatus
Patent number
4,414,665
Issue date
Nov 8, 1983
Nippon Telegraph and Telephone Public Corp.
Kenji Kimura
G11 - INFORMATION STORAGE
Information
Patent Grant
Logical waveform generator
Patent number
4,310,802
Issue date
Jan 12, 1982
Nippon Telegraph & Telephone Public Corp.
Yoshichika Ichimiya
G01 - MEASURING TESTING
Information
Patent Grant
High speed data logical comparison device
Patent number
4,270,116
Issue date
May 26, 1981
Nippon Telegraph & Telephone Public Corporation
Yoshichika Ichimiya
G06 - COMPUTING CALCULATING COUNTING