Shigeru Sugamori

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test method, test system and assist board
- Patent number 7,596,730
- Issue date Sep 29, 2009
- Advantest Corporation
- Yuya Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Test system, added apparatus, and test method
- Patent number 7,209,849
- Issue date Apr 24, 2007
- Advantest Corporation
- Yuya Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test method, test system and assist board
- Publication number 20070234146
- Publication date Oct 4, 2007
- Advantest Corporation
- Yuya Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system storing pin calibration data in non-volat...
- Publication number 20030110427
- Publication date Jun 12, 2003
- ADVANTEST CORPORATION
- Rochit Rajsuman
- G01 - MEASURING TESTING