Shigeru Takada

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,662,647
- Issue date Feb 16, 2010
- Renesas Technology Corp.
- Eisaku Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,498,180
- Issue date Mar 3, 2009
- Renesas Technology Corp.
- Eisaku Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electronic clinical thermometer
- Patent number 7,441,950
- Issue date Oct 28, 2008
- Ishizuka Electronics, Corp.
- Jun Kamiyama
- G01 - MEASURING TESTING
Information Patent Grant
Test socket, method of manufacturing the test socket, test method u...
- Patent number 7,112,976
- Issue date Sep 26, 2006
- Misubishi Denki Kabushiki Kaisha
- Yasushi Tokumo
- G01 - MEASURING TESTING
Information Patent Grant
Test socket, method of manufacturing the test socket, test method u...
- Patent number 6,794,890
- Issue date Sep 21, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Yasushi Tokumo
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a semiconductor device with contac...
- Patent number 6,621,286
- Issue date Sep 16, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Takada
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal element, contact terminal device
- Patent number 6,384,470
- Issue date May 7, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kunio Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Test socket having improved contact terminals, and method of formin...
- Patent number 6,344,753
- Issue date Feb 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Takada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20090035881
- Publication date Feb 5, 2009
- Renesas Technology Corp.
- Eisaku Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20060220668
- Publication date Oct 5, 2006
- Renesas Technology Corp.
- Eisaku Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Probe for electronic clinical thermometer
- Publication number 20060209920
- Publication date Sep 21, 2006
- Ishizuka Electronics Corp.
- Jun Kamiyama
- G01 - MEASURING TESTING
Information Patent Application
Test socket, method of manufacturing the test socket, test method u...
- Publication number 20040209491
- Publication date Oct 21, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Yasushi Tokumo
- G01 - MEASURING TESTING
Information Patent Application
Contact terminal element, contact terminal device, manufacture ther...
- Publication number 20020005569
- Publication date Jan 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kunio Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspecting semiconductor device
- Publication number 20010054710
- Publication date Dec 27, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Takada
- G01 - MEASURING TESTING

Shigeru Takada

Person

Patents Grantslast 30 patents

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Probe for electronic clinical thermometer

Test socket, method of manufacturing the test socket, test method u...

Test socket, method of manufacturing the test socket, test method u...

System and method for inspecting a semiconductor device with contac...

Contact terminal element, contact terminal device

Test socket having improved contact terminals, and method of formin...

Patents Applicationslast 30 patents

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

Method for manufacturing semiconductor device

Probe for electronic clinical thermometer

Test socket, method of manufacturing the test socket, test method u...

Contact terminal element, contact terminal device, manufacture ther...

System and method for inspecting semiconductor device