Shigeru Takemoto

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for inspecting predetermined region on surface...
- Patent number 6,184,526
- Issue date Feb 6, 2001
- Nikon Corporation
- Yoshiaki Kohama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer, adjusting method therefor, stage apparatus having t...
- Patent number 5,764,361
- Issue date Jun 9, 1998
- Nikon Corporation
- Kinya Kato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for binarizing images
- Patent number 5,200,841
- Issue date Apr 6, 1993
- Nikon Corporation
- Kenichi Kotaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspecting apparatus
- Patent number 4,870,693
- Issue date Sep 26, 1989
- Nikon Corporation
- Tetsuyuki Arai
- G06 - COMPUTING CALCULATING COUNTING