Shigeru Takezawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing method and testing system
- Patent number 11,150,182
- Issue date Oct 19, 2021
- Yokogawa Electric Corporation
- Yoshihisa Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Multi-component gas analysis system and multi-component gas analysi...
- Patent number 10,605,724
- Issue date Mar 31, 2020
- Yokogawa Electric Corporation
- Shigeru Takezawa
- F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information Patent Grant
Numeric value search apparatus and numeric value search method
- Patent number 7,219,111
- Issue date May 15, 2007
- Yokogawa Electric Corporation
- Takuya Saitou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Waveform measuring instrument using interpolated data
- Patent number 7,219,025
- Issue date May 15, 2007
- Yokogawa Electric Corporation
- Takuya Saitou
- G01 - MEASURING TESTING
Information Patent Grant
Waveform measuring instrument using equivalent time sampling
- Patent number 6,909,979
- Issue date Jun 21, 2005
- Yokogawa Electric Corporation
- Takuya Saitou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING METHOD AND TESTING SYSTEM
- Publication number 20200256792
- Publication date Aug 13, 2020
- YOKOGAWA ELECTRIC CORPORATION
- Yoshihisa Hidaka
- G01 - MEASURING TESTING
Information Patent Application
MULTI-COMPONENT GAS ANALYSIS SYSTEM AND MULTI-COMPONENT GAS ANALYSI...
- Publication number 20160349176
- Publication date Dec 1, 2016
- YOKOGAWA ELECTRIC CORPORATION
- Shigeru TAKEZAWA
- G01 - MEASURING TESTING
Information Patent Application
Numeric value search apparatus and numeric value search method
- Publication number 20040064490
- Publication date Apr 1, 2004
- YOKOGAWA ELECTRIC CORPORATION
- Takuya Saitou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Waveform measuring instrument using equivalent time sampling
- Publication number 20030120443
- Publication date Jun 26, 2003
- YOKOGAWA ELECTRIC CORPORATION
- Takuya Saitou
- G01 - MEASURING TESTING
Information Patent Application
Waveform measuring instrument using interpolated data
- Publication number 20030115003
- Publication date Jun 19, 2003
- YOKOGAWA ELECTRIC CORPORATION
- Takuya Saitou
- G01 - MEASURING TESTING