Shigeru Wakana

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Mobara, JP

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Patents Grantslast 30 patents

Information Patent Grant
System for measuring foreign materials in liquid
- Patent number 4,890,481
- Issue date Jan 2, 1990
- Hitachi, Ltd.
- Masayoshi Ezawa
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring foreign materials in liquid
- Patent number 4,779,451
- Issue date Oct 25, 1988
- Hitachi, Ltd.
- Masayoshi Ezawa
- G01 - MEASURING TESTING
Information Patent Grant
Projection tube whose coolant contains an ethylene oligomer
- Patent number 4,717,853
- Issue date Jan 5, 1988
- Hitachi, Ltd.
- Masayoshi Ezawa
- H01 - BASIC ELECTRIC ELEMENTS