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Shigeru Yoshinari
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Dispensing apparatus, dispensing method, and analyzer
Patent number
7,748,281
Issue date
Jul 6, 2010
Beckman Coulter, Inc.
Norichika Fukushima
G01 - MEASURING TESTING
Information
Patent Grant
Ionic concentration measuring apparatus and method
Patent number
4,512,852
Issue date
Apr 23, 1985
Olympus Optical Co., Ltd.
Kosaku Tsuboshima
G01 - MEASURING TESTING
Information
Patent Grant
Liquid treating device for chemical analysis apparatus
Patent number
4,318,885
Issue date
Mar 9, 1982
Olympus Optical Co., Ltd.
Nobuyoshi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring ion activities
Patent number
4,236,988
Issue date
Dec 2, 1980
Olympus Optical Co., Ltd.
Nobuyoshi Suzuki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DISPENSING APPARATUS, DISPENSING METHOD, AND ANALYZER
Publication number
20080236301
Publication date
Oct 2, 2008
OLYMPUS CORPORATION
Norichika FUKUSHIMA
G01 - MEASURING TESTING