TREA

Shigesato Iwasa

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  • Harvard, MA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Monolithic detector array apparatus
    • Patent number 5,446,284
    • Issue date Aug 29, 1995
    • Loral Infrared & Imaging Systems, Inc.
    • Neal R. Butler
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gate coupled input circuit
    • Patent number 4,902,894
    • Issue date Feb 20, 1990
    • Honeywell Inc.
    • Neal R. Butler
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gate coupled input circuit
    • Patent number 4,897,547
    • Issue date Jan 30, 1990
    • Honeywell Inc.
    • Shigesato Iwasa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gate coupled input circuit
    • Patent number 4,831,257
    • Issue date May 16, 1989
    • Honeywell Inc.
    • Jeff L. McClelland
    • G01 - MEASURING TESTING