Shigeto Isakozawa

Person

Katsuta, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for observing inside structures, and specimen...
- Patent number 8,134,131
- Issue date Mar 13, 2012
- Hitachi, Ltd.
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Element mapping unit, scanning transmission electron microscope, an...
- Patent number 7,928,376
- Issue date Apr 19, 2011
- Hitachi, Ltd.
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam equipment
- Patent number 7,923,701
- Issue date Apr 12, 2011
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for observing inside structures, and specimen...
- Patent number 7,476,872
- Issue date Jan 13, 2009
- Hitachi Ltd.
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for observing inside structures, and specimen...
- Patent number 7,462,830
- Issue date Dec 9, 2008
- Hitachi Ltd.
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam equipment
- Patent number 7,375,330
- Issue date May 20, 2008
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle system and a method for measuring image magnification
- Patent number 7,372,047
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 7,250,601
- Issue date Jul 31, 2007
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Micro manipulator
- Patent number 7,146,872
- Issue date Dec 12, 2006
- Hitachi, Ltd.
- Kazuhiro Morita
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 7,067,805
- Issue date Jun 27, 2006
- Hitachi High-Technologies Corporation
- Kazutoshi Kajl
- G01 - MEASURING TESTING
Information Patent Grant
Ultimate analyzer, scanning transmission electron microscope and ul...
- Patent number 6,933,501
- Issue date Aug 23, 2005
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 6,930,306
- Issue date Aug 16, 2005
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for observing element distribution
- Patent number 6,855,927
- Issue date Feb 15, 2005
- Hitachi High-Technologies Corporation
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning transmission electron microscopy
- Patent number 6,822,233
- Issue date Nov 23, 2004
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultimate analyzer, scanning transmission electron microscope and ul...
- Patent number 6,794,648
- Issue date Sep 21, 2004
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 6,703,613
- Issue date Mar 9, 2004
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of circuit patterns for defects and analysis of defects...
- Patent number 6,566,654
- Issue date May 20, 2003
- Hitachi, Ltd.
- Ryuichi Funatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning transmission electron microscopy
- Patent number 6,531,697
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter and electron microscope equipped with the energy filter
- Patent number 6,150,657
- Issue date Nov 21, 2000
- Hitachi, Ltd.
- Koji Kimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 6,051,834
- Issue date Apr 18, 2000
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method of observing element di...
- Patent number 5,981,948
- Issue date Nov 9, 1999
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,866,905
- Issue date Feb 2, 1999
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Sample evaluation/process observation system and method
- Patent number 5,783,830
- Issue date Jul 21, 1998
- Hitachi, Ltd.
- Hiroshi Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope with camera system
- Patent number 5,717,207
- Issue date Feb 10, 1998
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,552,602
- Issue date Sep 3, 1996
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope specimen holder
- Patent number 5,367,171
- Issue date Nov 22, 1994
- Hitachi, Ltd.
- Takashi Aoyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,142,149
- Issue date Aug 25, 1992
- Hitachi, Ltd.
- Shigeto Isakozawa
- G01 - MEASURING TESTING
Information Patent Grant
Field emission electron device which produces a constant beam current
- Patent number 5,134,289
- Issue date Jul 28, 1992
- Hitachi, Ltd.
- Hisaya Murakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam generating apparatus of multi-stage accelerat...
- Patent number 5,059,859
- Issue date Oct 22, 1991
- Hitachi, Ltd.
- Junji Endo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission type electron microscope
- Patent number 5,013,915
- Issue date May 7, 1991
- Hitachi, Ltd.
- Shigeto Isakozawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Observing Inside Structures, and Specimen...
- Publication number 20090302234
- Publication date Dec 10, 2009
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam equipment
- Publication number 20090242794
- Publication date Oct 1, 2009
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR OBSERVING INSIDE STRUCTURES, AND SPECIMEN...
- Publication number 20070252091
- Publication date Nov 1, 2007
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam equipment
- Publication number 20060219908
- Publication date Oct 5, 2006
- Hitachi High-Technologies Corporation
- Hiromi Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20060163479
- Publication date Jul 27, 2006
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Element mapping unit, scanning transmission electron microscope, an...
- Publication number 20060011836
- Publication date Jan 19, 2006
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle system and a method for measuring image magnification
- Publication number 20050189501
- Publication date Sep 1, 2005
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for observing inside structures, and specimen...
- Publication number 20050061971
- Publication date Mar 24, 2005
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20040188613
- Publication date Sep 30, 2004
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20040183011
- Publication date Sep 23, 2004
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20040169143
- Publication date Sep 2, 2004
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for observing element distribution
- Publication number 20040000641
- Publication date Jan 1, 2004
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for scanning transmission electron microscopy
- Publication number 20030127595
- Publication date Jul 10, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20030085356
- Publication date May 8, 2003
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20030085350
- Publication date May 8, 2003
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Micro manipulator
- Publication number 20030056364
- Publication date Mar 27, 2003
- Kazuhiro Morita
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20020096632
- Publication date Jul 25, 2002
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS ELECTRON MICROSCOPE
- Publication number 20010045515
- Publication date Nov 29, 2001
- YUJI SATO
- H01 - BASIC ELECTRIC ELEMENTS

Shigeto Isakozawa

Person

Patents Grantslast 30 patents

Method and apparatus for observing inside structures, and specimen...

Element mapping unit, scanning transmission electron microscope, an...

Charged particle beam equipment

Method and apparatus for observing inside structures, and specimen...

Method and apparatus for observing inside structures, and specimen...

Charged particle beam equipment

Charged particle system and a method for measuring image magnification

Energy spectrum measuring apparatus, electron energy loss spectrome...

Micro manipulator

Energy spectrum measuring apparatus, electron energy loss spectrome...

Ultimate analyzer, scanning transmission electron microscope and ul...

Electron microscope

Method and apparatus for observing element distribution

Method and apparatus for scanning transmission electron microscopy

Ultimate analyzer, scanning transmission electron microscope and ul...

Energy spectrum measuring apparatus, electron energy loss spectrome...

Inspection of circuit patterns for defects and analysis of defects...

Method and apparatus for scanning transmission electron microscopy

Energy filter and electron microscope equipped with the energy filter

Electron microscope

Transmission electron microscope and method of observing element di...

Electron microscope

Sample evaluation/process observation system and method

Transmission electron microscope with camera system

Electron microscope

Electron microscope specimen holder

Electron microscope

Field emission electron device which produces a constant beam current

Charged particle beam generating apparatus of multi-stage accelerat...

Transmission type electron microscope

Patents Applicationslast 30 patents

Method and Apparatus for Observing Inside Structures, and Specimen...

Charged particle beam equipment

METHOD AND APPARATUS FOR OBSERVING INSIDE STRUCTURES, AND SPECIMEN...

Charged particle beam equipment

Energy spectrum measuring apparatus, electron energy loss spectrome...

Element mapping unit, scanning transmission electron microscope, an...

Charged particle system and a method for measuring image magnification

Method and apparatus for observing inside structures, and specimen...

Electron microscope

Energy spectrum measuring apparatus, electron energy loss spectrome...

Ultimate analyzer, scanning transmission electron microscope and ul...

Method and apparatus for observing element distribution

Method and apparatus for scanning transmission electron microscopy

Ultimate analyzer, scanning transmission electron microscope and ul...

Ultimate analyzer, scanning transmission electron microscope and ul...

Micro manipulator

Energy spectrum measuring apparatus, electron energy loss spectrome...

ANALYSIS ELECTRON MICROSCOPE