Shigetsune Torin

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Santa Rosa, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Noise measurement system and method
- Patent number 7,010,443
- Issue date Mar 7, 2006
- Agilent Technologies, Inc.
- Shigetsune Torin
- G01 - MEASURING TESTING
Information Patent Grant
Automated electronic calibration apparatus
- Patent number 6,965,241
- Issue date Nov 15, 2005
- Agilent Technologies, Inc.
- James C. Liu
- G01 - MEASURING TESTING
Information Patent Grant
Electronic calibration circuit for calibrating a network analyzer
- Patent number 6,914,436
- Issue date Jul 5, 2005
- Agilent Technologies, Inc.
- James C. Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Noise measurement system and method
- Publication number 20050096859
- Publication date May 5, 2005
- Shigetsune Torin
- G01 - MEASURING TESTING
Information Patent Application
Electronic calibration circuit for calibrating a network analyzer
- Publication number 20040150411
- Publication date Aug 5, 2004
- James C. Liu
- G01 - MEASURING TESTING