Shigeyoshi GOKA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
CPT resonance generation method, CPT resonance detection method, CP...
- Patent number 9,954,544
- Issue date Apr 24, 2018
- Ricoh Company, Ltd.
- Shigeyoshi Goka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Atomic oscillator, method of detecting coherent population trapping...
- Patent number 9,917,592
- Issue date Mar 13, 2018
- Ricoh Company, Ltd.
- Yuichiro Yano
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Atomic oscillator and interrogation method of coherent population t...
- Patent number 9,444,476
- Issue date Sep 13, 2016
- Ricoh Company, Ltd.
- Shigeyoshi Goka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Atomic oscillator, method of detecting coherent population trapping...
- Patent number 9,136,851
- Issue date Sep 15, 2015
- Ricoh Company, Ltd.
- Yuichiro Yano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ATOMIC OSCILLATOR
- Publication number 20190245315
- Publication date Aug 8, 2019
- Tokyo Metropolitan University
- Shigeyoshi GOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CPT RESONANCE GENERATION METHOD, CPT RESONANCE DETECTION METHOD, CP...
- Publication number 20160269037
- Publication date Sep 15, 2016
- RICOH COMPANY, LTD.
- Shigeyoshi GOKA
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC OSCILLATOR, METHOD OF DETECTING COHERENT POPULATION TRAPPING...
- Publication number 20150338476
- Publication date Nov 26, 2015
- RICOH COMPANY, LTD.
- Yuichiro Yano
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC OSCILLATOR AND INTERROGATION METHOD OF COHERENT POPULATION T...
- Publication number 20150222285
- Publication date Aug 6, 2015
- RICOH COMPANY, LTD.
- Shigeyoshi Goka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ATOMIC OSCILLATOR, METHOD OF DETECTING COHERENT POPULATION TRAPPING...
- Publication number 20140225678
- Publication date Aug 14, 2014
- TOKYO METROPOLITAN UNIVERSITY, MUNICIPAL UNIVERSITY CORP.
- Yuichiro YANO
- G01 - MEASURING TESTING